2001 IEEE Nuclear Science Symposium Conference Record (Cat. No.01CH37310)
DOI: 10.1109/nssmic.2001.1009671
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Low frequency noise characterization of very large value resistors

Abstract: Several typo have been found. In Table 1 there are 2 our transcription errors. The unit of the term "beta" is p/GOhm. In the last column the value of the first cell should be 140.6 instead of 133.5, while the second cell 127.6 instead of 112.

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Cited by 12 publications
(12 citation statements)
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“…They also are located at room temperature, close to the preamplifier, and consist of metal films (Micro-Ohm) with a value of 30 GΩ each. Their manufacturing process and large value have been chosen in order to maintain as low as possible their thermal and low frequency noise contribution [45]. All the necessary settings for the front-end and the biasing system are programmed remotely via computer, in order to allow the optimization of the overall dynamic performance separately for each detector [42].…”
Section: Methodsmentioning
confidence: 99%
“…They also are located at room temperature, close to the preamplifier, and consist of metal films (Micro-Ohm) with a value of 30 GΩ each. Their manufacturing process and large value have been chosen in order to maintain as low as possible their thermal and low frequency noise contribution [45]. All the necessary settings for the front-end and the biasing system are programmed remotely via computer, in order to allow the optimization of the overall dynamic performance separately for each detector [42].…”
Section: Methodsmentioning
confidence: 99%
“…Although the thermal noise of resistor R s is now introduced in, this noise is reduced by the same factor. Meanwhile, there is no 1/f noise in the resistor due to the large number of carriers [12]. The proposed folded cascode amplifier with source degeneration load consequently helps a lot to decrease 1/f noise and does not increase thermal noise.…”
Section: Low Noise Amplifier Topologymentioning
confidence: 99%
“…To achieve low input referred noise, W has to be set in a very large value [5], resulting in large area.…”
Section: Circuit Designmentioning
confidence: 99%