Low-energy ion scattering: A quantitative method?

Temperature-dependent in-situ LEIS measurement of W surface enrichment by 250 eV D sputtering of EUROFER

“…are located in the left wing of the peak), but the W peaks in figure 5 W is a minor constituent and the achieved surface enrichment is not very large, is much smaller than in the pure element. This questions the conclusion drawn in [30] where the comparison with data from a pure reference sample has been assessed to be sufficient for quantification. From the similar shape of the W peaks in figure 5 one can conclude that the contribution of reionised scattered ions for all irradiation steps is similar and the relative increase of surface concentrations is still correct.…”

Synthesis and characterization of plant extracted silver nanoparticles and advances in dental implant applications

“…It is generally known that LEIS has the highest sensitivity to the surface of any technology now in use for surface analysis.The approach allows one to determine the structure and elemental content of a material [ 145 , 146 , 147 ]. Strong LEIS is an essential surface analysis technique that plays a significant role in the analysis of SAM-functionalized nanomaterials [ 148 ].…”

Silver nanoparticles: synthesis, characterisation and biomedical applications

“…LEIS is a commonly used surface analytical technique, which is well recognised for its supreme surface sensitivity. With the help of this technique, the structure and the elemental composition of a given sample can be deduced [100][101][102]. Moreover, high sensitivity LEIS is a valuable surface analytical method for the characterization of SAM-functionalised nanomaterials [103].…”