Low electron emission yield electrodeposited silver coating for electron multipacting mitigation

Belfio, Julie; Lazar, Florica; Belhaj, Mohamed; Jbara, O.

doi:10.1016/j.surfin.2023.102651

Cited by 2 publications

(2 citation statements)

References 31 publications

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“…The initial conditions and physical parameters utilized in the simulations are presented in Table 1. So far, most of the multipacting studies focused on investigating multipacting mechanisms 19,20 , developing prediction techniques 21,22 , and mitigating this phenomenon using surface treatments 23 . However, limited analysis has examined how the uncertainties of the SEY parameters affect the multipacting threshold evaluation.…”

Section: Figurementioning

confidence: 99%

Analysis of multipacting threshold sensitivity to the random distributions of the secondary electron yield parameters

Kazemi,

Mostajeran,

Romanov

2023

Preprint

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The way multipacting develops, depends strongly on the secondary emission property of the surface material. The knowledge of secondary electron yield is crucial for accurate prediction of the multipacting threshold. Variations in secondary electron yield parameters from experimental measurements create uncertainty, stemming from handling and surface preparation, and these uncertainties significantly affect multipacting threshold predictions. Despite their significance, the previous studies on the multipacting phenomenon did not adequately address the effect of an assumed random distribution of the secondary emission parameters on the multipacting threshold. Therefore, this paper aims to provide a comprehensive statistical study on how the different random distributions of the secondary emission parameters and, as a result, the uncertainty in the secondary electron yield affect multipacting thresholds. We focus on three commonly used distributions, namely uniform, normal, and truncated normal distributions, to define the uncertainty of random inputs. We use the chaos polynomial expansion method to determine how much each of the random parameters contributes to the multipacting threshold uncertainty. Additionally, we calculate Sobol sensitivity indices to evaluate the impact of the individual parameters or groups of parameters on the model outputs and study how different random distributions of these parameters affected the Sobol index results.

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Section: Figurementioning

confidence: 99%

Analysis of multipacting threshold sensitivity to the random distributions of the secondary electron yield parameters

Kazemi,

Mostajeran,

Romanov

2023

Preprint

View full text Add to dashboard Cite

show abstract

“…So far, most of the multipacting studies focused on investigating multipacting mechanisms 19 , 20 , developing prediction techniques 21 , 22 , and mitigating this phenomenon using surface treatments 23 . However, limited analysis has examined how the uncertainties of the SEY parameters affect the multipacting threshold evaluation.…”

Section: Introductionmentioning

confidence: 99%

Analysis of multipacting threshold sensitivity to the random distributions of the secondary electron yield parameters

Kazemi,

Mostajeran,

Romanov

2024

Sci Rep

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Low electron emission yield electrodeposited silver coating for electron multipacting mitigation

Cited by 2 publications

References 31 publications

Analysis of multipacting threshold sensitivity to the random distributions of the secondary electron yield parameters

Analysis of multipacting threshold sensitivity to the random distributions of the secondary electron yield parameters

Analysis of multipacting threshold sensitivity to the random distributions of the secondary electron yield parameters

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