In this work, on different substrate materials thermally cured polymer thick-film pastes are connected to Surface Mount Technology resistors using a SnBiAg solder alloy. The effect of substrate pre-treatment with atmospheric plasma and thermal cycling on the shear strength of these interconnection is investigated, and the shear forces obtained are graded using MIL-STD 883. In particular, the build-up of solder interconnections on conductive structures made of commercially available copper-containing polymer thick-film pastes and their mechanical characterization is novel. As well as the mechanical characterization of conductive structures, made of polymer thick-film, on plasma-treated substrates and their grading using the MIL-STD 883. In addition, interconnections with silver-containing conductive structures are realized for comparison. Depending on the interconnection system, component mean shear forces of up to 31 N are achieved. While some systems meet the 1.25 x criterion of MIL-STD 883, the majority of the systems investigated do not meet the 1.00 x criterion. Hereby, the adhesion between the conductive structure and the substrate usually fails. Plasma pre-treatment shows an adhesion-increasing effect only for a proportion of substrate materials used, as does thermal aging. Thermal loads can also impair the adhesive strength.