Long Lifetime Hole Traps at Grain Boundaries in CdTe Thin-Film Photovoltaics

Abstract

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Nanometre-scale optical property fluctuations in Cu2ZnSnS4 revealed by low temperature cathodoluminescence

“…6b, have higher intensity than the neighbouring grain interiors. A higher grain boundary intensity is unexpected, since these are typically regions of stronger non-radiative recombination [29]. However, Fig.…”

Characterization of point defects in CdTe by positron annihilation spectroscopy

“…Substitutional acceptor impurities have a negative charge and can localize positrons at low temperatures, but there is no associated open volume so their annihilation characteristics are similar to perfect lattice positron states. Other experimental methods commonly observe a shallow acceptor in CdTe which has been attributed to oxygen, 17,18 including the substitutional center O Te . 19 The vacancy defect lifetime and the calculated bulk lifetime, s B , values obtained here are in agreement with earlier studies of CdTe and Cd 1Àx Zn x Te.…”

The role of transition radiation in cathodoluminescence imaging and spectroscopy of thin-foils

“…This is however not to be confused with the well-known behaviour of CdTe at low temperature (i.e. liquid nitrogen/helium cooled), where enhanced donor acceptor pair recombination is observed at the grain boundaries [10,[33][34]. P o is the power lost to backscattered electrons and nonradiative recombination at a free surface and/or grain boundary.…”

“…5b. The room temperature SEM-CL [10] and photoluminescence [32] spectrum for CdTe consists of a peak at ~820 nm wavelength as well as a high energy tail extending to ~760 nm wavelength. This is evident in Fig.…”

“…Cathodoluminescence (CL) in the electron microscope is a powerful technique for probing radiative transitions in dielectrics [1], plasmons [2][3], defect properties [4][5][6], strain [7] and carrier lifetime [8][9][10] at high spatial resolution. CL is typically implemented in a scanning electron microscope (SEM), but recently there has been renewed interest in its application as a transmission electron microscope (TEM) technique.…”