“…AFM can also be used for nanoindentation to provide in situ imaging ability without moving the sample, switching tips, relocating the area for scanning, or using an entirely different instrument to image the indentation [35,56,71,102,118]. Force modulation microscopy (FMM) which is an extension of AFM imaging, is used extensively for the characterization of mechanical properties and in applications such as imaging composition changes in a composite material, analyzing polymer homogeneity, and detecting contaminants in manufacturing processes [3,27,99]. Assembly of nanoparticles and linking them to electrical leads, such as random deposition of clusters between electrodes, binding by wet chemistry, and electrostatic trapping, all serve as other important applications of the AFM technique.…”