1997
DOI: 10.1063/1.1148420
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Localized surface elasticity measurements using an atomic force microscope

Abstract: of tips like the ones used in this work. They were acquired in a private communication with Brandon Comella at Rochester Institute of Technology, Dept. of Mech. Eng., and apply only to tapping mode tips ͑TESP͒ purchased through Digital Instruments.

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Cited by 87 publications
(40 citation statements)
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References 8 publications
(4 reference statements)
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“…Finally, several works have exploited dynamic force-distance curves in order to characterize sample elasticity [52,53].…”
Section: Resultsmentioning
confidence: 99%
“…Finally, several works have exploited dynamic force-distance curves in order to characterize sample elasticity [52,53].…”
Section: Resultsmentioning
confidence: 99%
“…The frequency of the applied signal is on the order of hundreds of kilohertz, which is faster than the z feedback loop is set up to track. Thus, topographic information can be separated from local variations in the sample's elastic properties, and the two types of images can be collected simultaneously [3,27,99].…”
Section: Determination Of Elasticitymentioning
confidence: 99%
“…AFM can also be used for nanoindentation to provide in situ imaging ability without moving the sample, switching tips, relocating the area for scanning, or using an entirely different instrument to image the indentation [35,56,71,102,118]. Force modulation microscopy (FMM) which is an extension of AFM imaging, is used extensively for the characterization of mechanical properties and in applications such as imaging composition changes in a composite material, analyzing polymer homogeneity, and detecting contaminants in manufacturing processes [3,27,99]. Assembly of nanoparticles and linking them to electrical leads, such as random deposition of clusters between electrodes, binding by wet chemistry, and electrostatic trapping, all serve as other important applications of the AFM technique.…”
Section: Introductionmentioning
confidence: 99%
“…Maivald et al (1991) and DeVecchio and Bhushan (1997) used an AFM in "force modulation mode" to measure local surface elasticities. AFM tip is scanned over the modulated sample surface with the feedback loop keeping the average force constant.…”
Section: Scratching Wear and Indentationmentioning
confidence: 99%