Local phonon analysis in InGaN film by mapping of Raman peak energy

Okamoto, Satoshi; Saito, Naomichi; Ma, Bei; Oki, K.; Morita, Ken; Ohkawa, Kazuhiro; Ishitani, Yoshihiro

doi:10.1109/iciprm.2019.8819132

2019 Compound Semiconductor Week (CSW) 2019

DOI: 10.1109/iciprm.2019.8819132

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Local phonon analysis in InGaN film by mapping of Raman peak energy

Satoshi Okamoto

Naomichi Saito

Bei Ma

et al.

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Local phonon analysis in InGaN film by mapping of Raman peak energy

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