2014
DOI: 10.1016/j.jallcom.2013.08.130
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Local order of Pb1−xLaxZr0.40Ti0.60O3 ferroelectric ceramic materials probed by X-ray absorption and Raman spectroscopies

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Cited by 8 publications
(2 citation statements)
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“…The PLZT family was previously characterized by X-ray absorption, X-ray diffraction, Raman spectroscopy and impedance spectroscopy (Mesquita et al, 2010(Mesquita et al, , 2012(Mesquita et al, , 2014. The samples with x = 0.12 and 0.15 present a slight displacement of the dielectric permittivity (" 0 ) curve with frequency, and can therefore be characterized as relaxors (Mesquita et al, 2010).…”
Section: Introductionmentioning
confidence: 99%
“…The PLZT family was previously characterized by X-ray absorption, X-ray diffraction, Raman spectroscopy and impedance spectroscopy (Mesquita et al, 2010(Mesquita et al, , 2012(Mesquita et al, , 2014. The samples with x = 0.12 and 0.15 present a slight displacement of the dielectric permittivity (" 0 ) curve with frequency, and can therefore be characterized as relaxors (Mesquita et al, 2010).…”
Section: Introductionmentioning
confidence: 99%
“…It was very difficult for AFE ceramic to withstand a large external field. In order to tailor the dielectric properties, A-and B-site compositional modifications in PLZST system with a ABO 3 perovskite-structure were usually employed [10,11]. Recoverable energy density (W re ) of 61 J/cm 3 with an efficiency of 33 % had been demonstrated in AFE PLZT thin films under an applied field of &4.3 MV/cm [12].…”
Section: Introductionmentioning
confidence: 99%