Local charge transport at different interfaces in epoxy composites

Jia, Beibei; Zhou, Jun; Chen, Yuqing; Lv, Zepeng; Guo, Hongliang; Zhang, Zixuan; Zhu, Zihe; Yu, Haoyu; Wang, Yan; Wu, Kai

doi:10.1088/1361-6528/ac705f

Cited by 4 publications

(6 citation statements)

References 49 publications

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“…This paper furthers research into the influence of filler on charge distribution and mobility characteristics on a micro-/nanometer scale in the dielectric composites based on our previous study [ 44 ] so as to deeply clarify the micro mechanism whereby the introduction of fillers improves the macroscopic dielectric properties of materials. Different from the existing reports, which applied vertical bias through the tip of KPFM, in this work, the external voltages were applied in a horizontal direction on the BTO/EP composite, which can effectively inhibit the capacitance effect between the tip and selected area of the sample.…”

Section: Introductionmentioning

confidence: 63%

Interfacial Insight of Charge Transport in BaTiO3/Epoxy Composites

et al. 2023

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Space charge accumulation greatly influences the dielectric performance of epoxy composites under high voltage. It has been reported that nano-fillers can suppress the charge accumulation in the bulk of insulation materials. However, it is still unclear how the nano-fillers influence the charge distribution at the interface between the filler and polymeric matrix. In this work, the dielectric properties and the local dynamic charge mobility behavior at the interface of barium titanate/epoxy resin (BTO/EP) composites were investigated from both bulk and local perspectives based on the macroscopic test techniques and in-situ Kelvin probe force microscopy (KPFM) methods. Charge injection and dissipation behavior exhibited significant discrepancies at different interfaces. The interface between BTO and epoxy is easy to accumulates a negative charge, and nanoscale BTO (n-BTO) particles introduces deeper traps than microscale BTO (m-BTO) to inhibit charge migration. Under the same bias condition, the carriers are more likely to accumulate near the n-BTO than the m-BTO particles. The charge dissipation rate at the interface region in m-BTO/EP is about one order of magnitude higher than that of n-BTO/EP. This work offers experimental support for understanding the mechanism of charge transport in dielectric composites.

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Section: Introductionmentioning

confidence: 63%

Interfacial Insight of Charge Transport in BaTiO3/Epoxy Composites

et al. 2023

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“…[3,75] The traditional acoustic method is not suitable for testing space charges at the interface region due to limited resolution. [75][76][77]85,86,94] Acoustic method calculates the charge density with a depth resolution of up to about 1 µm and typically has no lateral resolution. [160] The depth information provided by the acoustic method is not sufficient for accurately studying interfacial phenomena in thin dielectric films (less than 1 µm thick).…”

Section: Probe Microscopy Methodsmentioning

confidence: 99%

“…[56,59,142] However, PEA has a limitation of low space resolution in thin films due to the response of piezoelectric sensors and pressure waves. [57,77] Additionally, KPFM and electrostatic force microscopy (EFM) based on flexible scanning methods are promising technologies for measuring nanoscale surface and interface charges. [75,85,86,94] This section mainly discusses the macroscopic technique of the acoustic method (PEA) and the microscopic technique of the probe microscopy method (KPFM).…”

Section: Experimental Techniques Of Interface Chargesmentioning

confidence: 99%

“…The experimental scheme, combined with KPFM technology, is crucial to explain the interface charges. Although the surface potential measurement combined with Poisson's equation can calculate the charge density, the results may present large fluctuations and be affected by surface electrostatic charges, [75,77,87,89] making it challenging to study the interface charge characteristics quantitatively.…”

Section: Charge Characteristics At Electrode/dielectric Interfacementioning

confidence: 99%

“…[56,73,74] In recent years, the probe microscopy method has enabled atomic-level resolution imaging, making it possible to study charge behaviors at the submicron scale. [75][76][77][78][79] Kelvin probe force microscopy (KPFM) is a technique used to measure the potential difference between a sample and the tip. [79,80] KPFM measures the work function between the tip and the surface as a function of potential difference.…”

Section: Introductionmentioning

confidence: 99%

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Interface Charge Characteristics in Polymer Dielectric Contacts: Analysis of Acoustic Approach and Probe Microscopy

Wang

et al. 2023

Adv Materials Inter

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Interfaces are essential components in polymer contact systems, which widely exist in electronic devices and power equipment. Interface charge originating from the mismatch of the electronic structure in interfaces is one of the key issues to modify the device performance due to its multifunctional migration and accumulation behaviors. Hence, the detection and analysis of the interface charge characteristics are of great importance to deeply understand the polymer contact system in various devices. This paper presents an overview of recent research progress in the interface charge properties at dielectric interfaces. Based on the theoretical analysis of the MWS polarization and electronic localized states, two typical approaches of discussing the interface charges from micrometer to millimeter are mainly studied. Acoustic method is prevalent in detecting the space charge in various dielectrics. However, owing to its limited resolution (several µm), it is difficult to clarify the charge distributions at the interface with a micro‐scale. Probe microscopy presents a promising technique due to its flexible surface potential detection at a submicron scale. The challenges and prospects of acoustic and probe microscopy methods are discussed in this paper. The advanced techniques of interface charges can promote the development of new energy electronic devices.

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