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Lin, Zong Qi; Gu, Zu-Han

doi:10.1088/0959-7174/7/3/011

Cited by 1 publication

(2 citation statements)

References 12 publications

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“…This move is in agree- (2), and for small difference ∆θ i in incident angle the change in angle of incidence is equal to the change in angle of scattering observation to maximize the correlation function. This results in a memory line [10,15]. When increasing ∆θ i , a maximum of correlation can be found following angular condition (2).…”

Section: Memory Effect and General Cmentioning

confidence: 95%

“…In [10], the difference between the correlation peak value and unity was attributed to experimental alignment. A technique similar to the one presented in [15] was used to account for angular misalignment by numerically matching the two speckle patterns considered to obtain the maximum value of correlation achievable. These values remained yet well (0.8) below unity.…”

Section: Time-reversed Memory Effectmentioning

confidence: 99%

See 1 more Smart Citation

Angular correlation properties of 2D‐nano‐roughness‐induced speckle patterns for silica‐on‐silicon wafers

Bony

Takakura²,

Satzke

et al. 2003

phys. stat. sol. (c)

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Experimental observation of angular speckle correlations for two-dimensional nano-rough silica layers on silicon substrate are presented. The set-up makes use of a digital CCD camera to record the speckle patterns as a function of illumination and scattering angular conditions. C(1) correlations corresponding to the optical memory and time-reverse memory effects are reported for three different samples. C (10) correlation does not presently seem to be observable.

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Section: Memory Effect and General Cmentioning

confidence: 95%

Section: Time-reversed Memory Effectmentioning

confidence: 99%