2010
DOI: 10.1038/nphoton.2010.277
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Lithography at EUV wavelengths

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Cited by 162 publications
(130 citation statements)
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“…Current information technologies rely on growth and processing techniques that allow the fabrication of two-dimensional nanostructures [1]. Currently, this involves the exposure of a photoresist to light through a mask to generate a nanoscale pattern, which is subsequently transferred onto another material via deposition or etching processes [1].…”
Section: Introductionmentioning
confidence: 99%
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“…Current information technologies rely on growth and processing techniques that allow the fabrication of two-dimensional nanostructures [1]. Currently, this involves the exposure of a photoresist to light through a mask to generate a nanoscale pattern, which is subsequently transferred onto another material via deposition or etching processes [1].…”
Section: Introductionmentioning
confidence: 99%
“…Currently, this involves the exposure of a photoresist to light through a mask to generate a nanoscale pattern, which is subsequently transferred onto another material via deposition or etching processes [1].…”
Section: Introductionmentioning
confidence: 99%
“…These studies have shown that plasmas containing tin, where transitions of the type 4p 6 4d n -4p 5 4d n+1 + 4d n-1 4f overlap in ion stages from Sn 9+ -Sn 13+ to form an unresolved transition array (UTA) centered near 13.5 nm are the strongest emitters at this wavelength. To keep pace with Moore's law, research on shorter wavelength EUV sources has already begun [3][4][5][6][7][8].…”
mentioning
confidence: 99%
“…Switching to a shorter wavelength of around 6.5−6.7 nm while maintaining or increasing throughput in the lithography system would improve resolution by a further factor of two [3]. The possibility of a new source wavelength of 6.x nm has emerged due to progress in the fabrication of B 4 C (La/B 4 C or Mo/B 4 C) multilayers with a reflectivity of ~ 40 % in a 0.06 nm bandwidth near 6.7 nm [9] whose maximum theoretical reflectivity is close to 70% [10].…”
mentioning
confidence: 99%
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