A novel
fluorinated macromonomer (TFVE-Si) with four functional groups derived
from easily available tetraethoxysilane (TEOS) has been successfully
synthesized through the Piers–Rubinsztajn reaction using B(C6F5)3 as a catalyst. This procedure efficiently
avoids the generation of Si–OH and −Si–CH2–CH2– groups, which greatly affect
the properties of the organosiloxanes. Prepolymerizing the macromonomer
in mesitylene solution gives an oligomer which can form a flexible
and highly transparent free-standing cross-linked polysiloxane film
followed by a postpolymerization procedure at high temperature. The
cross-linked polysiloxane (thickness = 2 mm) shows a transmittance
of higher than 91% in the visible region and an absorbance of near
100% in the UV region (<350 nm), exhibiting its potential application
as a transparent coating for blocking ultraviolet rays in both household
and industrial uses. In particular, the cross-linked film shows low
dielectric constant (D
k
) of 2.50 and low dissipation factor (D
f
) of 4.0 × 10–3 at an ultrahigh
frequency of 10 GHz. This is the first example of nonporous polysiloxane
having both low D
k
and D
f
while conventional TEOS-based
polymers exhibit higher D
k
(>3.0). Moreover, D–E loop tests illustrate that the cross-linked polysiloxane possesses
excellent linear dielectric properties, further suggesting its good
insulating properties. Furthermore, the prepared polysiloxane exhibits
high thermostability with a 5 wt % loss temperature of 476 °C
and a glass transition temperature (T
g) of 110 °C as well as good mechanical strength (with an elastic
modulus of 1.1 GPa). Because of the existence of fluoro-containing
groups, the polysiloxane also shows high hydrophobicity. Furthermore,
TFVE-Si can efficiently improve the T
g of linear polysiloxane prepared from dimethylsiloxane with two functional
groups. These indicate that the fluorinated TEOS has potential application
in the microelectronics industry; especially, it can meet the requirement
of the high-frequency communication fields for the materials with
both low D
k
and D
f
.