Linear and nonlinear optical properties of (Pb,La)(Zr,Ti)O₃ferroelectric thin films grown by radio-frequency magnetron sputtering

Abstract

Linear and nonlinear optical properties of lanthanum-modified lead zirconate titanate (Pb0.92La0.08)(Zr0.65Ti0.35)O3 (PLZT 8/65/35) ferroelectric thin films are presented in this paper. The PLZT ferroelectric thin films were grown on quartz substrates by radio-frequency magnetron sputtering at 650 °C. Their crystalline structure and surface morphologies were examined by x-ray diffraction and atomic force microscopy, respectively. It was found that the PLZT thin films exhibit well-crystallized perovskite structure and good surface morphology. The fundamental optical constants (the band gap energy, linear refractive index and absorption coefficient) were obtained through the optical transmittance measurements. A Z-scan technique was used to investigate the optical nonlinearity of the PLZT thin films on quartz substrates. The films display a strong third-order nonlinear optical effect. A large and negative nonlinear refractive index n2 is determined to be 1.21 × 10−6 esu for the PLZT thin films. All results show that the PLZT ferroelectric thin films have potential applications in nonlinear optical devices.

Optical and dielectric studies on radio frequency sputtered Gd2O3 doped K0.5Na0.5NbO3 thin films for nonlinear photonic and microwave tunable device applications

“…The obtained nonlinear optical properties are comparable to other films deposited by using RF magnetron sputtering [10,54]. The larger values of n 2 , and b, were obtained for the film deposited in pure oxygen atmosphere and are 2.46 Â 10 À5 cm 2 /W and 5.02 cm/ W, respectively.…”

Thin films sputtered from Ba2NdFeNb4O15 multiferroic targets on BaFe12O19 coated substrates

“…The granular surface of films is typical of post-annealed films formed from amorphous film precursors. It was also observed in others materials [34] and is relatively independent of the buffer layer [35,36]. The root-mean-square (rms) roughness surface roughness is about 4.4 nm and 7.6 nm for PtS and BaM/PtS substrates.…”

Effect of thickness on dielectric, ferroelectric, and optical properties of Ni substituted Pb(Zr0.2Ti0.8)O3 thin films

“…Oscillating transmittance spectra were observed for 200 nm and 400 nm films, suggesting that they have a flat surface and a uniform thickness. [37][38][39] It was also observed that the number of oscillations decreases with decrease of film thickness. Optical absorption edge was observed at wavelength $300-350 nm (see Fig.…”