2018
DOI: 10.1021/acs.nanolett.8b00997
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Limits of Directed Self-Assembly in Block Copolymers

Abstract: Understanding the conditions under which defects appear in self-assembling soft-matter systems is of great importance, for example, in the development of block-copolymer (BCP) nanolithography. Here, we explore the limits of the directed self-assembly of BCPs by deliberately adding random imperfections to the template. Our results show that defects emerge due to local "shear-like" distortions of the polymer-template system, a new mechanism that is fundamentally different from the canonical mechanisms of 2D melt… Show more

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Cited by 15 publications
(18 citation statements)
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“…It has pushed the limits of feature size, offering extremely low defectivity and high throughput on large areas with sub-lithographic resolution (≈ 10 nm). BCP has great potential for nanoelectronics devices, energy conversion, and storage [42][43][44]. Table 1.…”
Section: Pros and Cons Of The Nanosphere Lithography For Diamond Strumentioning
confidence: 99%
“…It has pushed the limits of feature size, offering extremely low defectivity and high throughput on large areas with sub-lithographic resolution (≈ 10 nm). BCP has great potential for nanoelectronics devices, energy conversion, and storage [42][43][44]. Table 1.…”
Section: Pros and Cons Of The Nanosphere Lithography For Diamond Strumentioning
confidence: 99%
“…Mesoscopic modeling is a flexible and powerful theoretical tool to study inhomogeneous polymeric systems. Among the various modeling methods, MesoDyn has been validated as an effective approach to explore the phase behavior of polymer systems at the mesoscale [43,44,45,46,47,48]. Furthermore, MesoDyn facilitates treating various chain architectures of polymers, from linear [49] to branched [41,42,50]; MesoDyn is a mature method to investigate the phase behavior of flexible block copolymers.…”
Section: Models and Parameter Settingsmentioning
confidence: 99%
“…The design of such patterned substrates can be facilitated by using computer simulations . To model structures on given substrate patterns, simulations were already employed in some of the examples discussed above, e.g., Ruiz et al or Tavakkoli et al Computers have also been useful in identifying the limits of directing self‐assembly on substrate patterns with random imperfections, and have been successfully used for predicting the substrate patterns required for directing block copolymer self‐assembly into desired morphologies . Such indirect modeling efforts for directed self‐assembly can be expected to become a powerful tool for the patterning of more complex self‐assembled structures in 3D.…”
Section: Directing Block Copolymer Self‐assembly In Three Dimensionsmentioning
confidence: 99%