Limitations of multilevel storage in charge-coupled devices

Zohdy, Hoda S. Abdel-Aty; Chamberlain, S.G.; Watt, L.A.K.

doi:10.1109/t-ed.1980.20095

Cited by 4 publications

(5 citation statements)

References 25 publications

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“…Experimental measurements have been carried out for the overall noise in a 16-bit surface n-channel charge-coupled shift register [4]. Measurements are given in Fig.…”

Section: Resultsmentioning

confidence: 99%

“…5 for the overall noise with different charge packet sizes with a clock frequency of 150 kHz. Measurements of the different sources of noise in the CCD were also successfully carried out [4], [8], e.g., the fast interface-state trapping and transfer losses noise mea surements are shown in Fig. 6 for differet charge packet sizes.…”

Section: Resultsmentioning

confidence: 99%

“…Noise spectral intensity measurements in CCD's are important in determining the feasibility of the different performance applications, e.g., multilevel storage application [2], [4]. As an example of the output from sam pled-data circuits, a picture of a CCD shift register output is shown in Fig.…”

Section: Introductionmentioning

confidence: 99%

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The development and application of the correlation method for noise spectral intensity measurements in sampled-data circuits

Abdel-Aty-Zohdy

Chamberlain

1982

IEEE Trans. Instrum. Meas.

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In sampled-data systems, spectral intensity noise measurements are difficult to carry out using ordinary conventional techniques, this is due to the simultaneous presence of the analog signals and the clock pulses at the output. In this paper, we describe the correlation method which we further developed and adapted for spectral intensity noise measurements in sampled-data systems. As an example, measurements on CCD's will be described and further applications of this method, such as in small-geometry cells, will be outlined.

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“…Experimental measurements have been carried out for the overall noise in a 16-bit surface n-channel charge-coupled shift register [4]. Measurements are given in Fig.…”

Section: Resultsmentioning

confidence: 99%

Section: Resultsmentioning

confidence: 99%

See 1 more Smart Citation

The development and application of the correlation method for noise spectral intensity measurements in sampled-data circuits

Abdel-Aty-Zohdy

Chamberlain

1982

IEEE Trans. Instrum. Meas.

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“…Presently, 6-logic values are achievable4; however, there is much interest in 4-logic levels, since 4 is a power of 2 and thus more compatible with binary circuits. The current limitation on the number of logic levels is not noise, but the chip devices that produce logic values.…”

Section: Little Powermentioning

confidence: 99%

“…Modern CCD circuits, for example, lose only about one in every 10,000 electrons in each charge transfer. 6 Another improvement in CCD processing followed shortly in 1972. Up to that point, all CCD circuits had the property that the charge resided on the IC surface.…”

Section: Little Powermentioning

confidence: 99%

Multiple-valued CCD circuits

Butler

Kerkhoff

1988

Computer

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Multilevel storage memory using serial—parallel–serial charge—coupled device

Nakamura

1989

Electron Comm Jpn Pt II

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Since the CCD can handle analog signals directly, it is used widely for delay lines, filters, imaging elements and imaging memories. This paper considers the multilevel storage memory of an SPS (serial‐parallel‐serial)‐CCD applied to field memories of image signals. First, a charge transfer model for an SPS‐CCD is created. By means of the transfer function derived from this model, it is clarified that the transfer losses of the serial register and the parallel register degrade the frequency characteristics of the amplitude and phase. It is pointed out that this degradation can be improved significantly by compensation of the transfer losses of the two serial registers and the parallel register. Since realization of a circuit for rigorous compensation of the transfer loss is extremely difficult, a simple transfer loss compensation method is also studied in which the SPS‐CCD is considered as a cascade connection of two serial registers. It is found that the difference in the effect of simple and rigorous compensations is at most 0.6 percent in the case of 50 percent eye degradation. Hence, the effectiveness of the simple compensation is confirmed. Also, by using a commercially available CCD, an experiment for eight‐level storage memory is carried out in which a simple transfer loss compensation is applied. It is confirmed that agreement of the calculated and measured signal error rates is excellent.

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Limitations of multilevel storage in charge-coupled devices

Cited by 4 publications

References 25 publications

The development and application of the correlation method for noise spectral intensity measurements in sampled-data circuits

The development and application of the correlation method for noise spectral intensity measurements in sampled-data circuits

Multiple-valued CCD circuits

Multilevel storage memory using serial—parallel–serial charge—coupled device

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