The development and application of the correlation method for noise spectral intensity measurements in sampled-data circuits

Abstract

In sampled-data systems, spectral intensity noise measurements are difficult to carry out using ordinary conventional techniques, this is due to the simultaneous presence of the analog signals and the clock pulses at the output. In this paper, we describe the correlation method which we further developed and adapted for spectral intensity noise measurements in sampled-data systems. As an example, measurements on CCD's will be described and further applications of this method, such as in small-geometry cells, will be outlined.