2019 10th International Conference on Power Electronics and ECCE Asia (ICPE 2019 - ECCE Asia) 2019
DOI: 10.23919/icpe2019-ecceasia42246.2019.8797029
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Lifetime comparison of IGBT modules in Grid-connected Multilevel PV inverters Considering Mission Profile

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Cited by 12 publications
(5 citation statements)
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“…Solar Irradiance and Ambient Temperature with one-minute resolution for one year from Sep'18 to Aug'19 is considered as mission profile. At India mission profile taken from [11], similarly, at Denmark it is taken from [12]. The rainflow analysis, Monto Carlo simulation are implemented for analysis.…”
Section: Reliability Assessment Methodologymentioning
confidence: 99%
“…Solar Irradiance and Ambient Temperature with one-minute resolution for one year from Sep'18 to Aug'19 is considered as mission profile. At India mission profile taken from [11], similarly, at Denmark it is taken from [12]. The rainflow analysis, Monto Carlo simulation are implemented for analysis.…”
Section: Reliability Assessment Methodologymentioning
confidence: 99%
“…From the yearly T j , N i , T jm , and ∆T j , which are obtained using the rainflow-counting algorithm [27]. The lifetime can be calculated using Miner's rule, as shown in Equation (2).…”
Section: Reliability Analysis Of Hybrid Si/sic Module Based Pv Invertermentioning
confidence: 99%
“…The most commonly used approach for thermal stress modeling has previously been presented in Fig. 6 [15]- [19]. This model will be referred to as a transient thermal model, since it includes all transient thermal impedances in the thermal network (e.g., between the junction and case Z jc and between the case and ambient Z ca ).…”
Section: A Transient Thermal Modelmentioning
confidence: 99%
“…However, due to the requirement of long-term simulation studies, a lumped thermal network is typically applied for analyzing thermal stress under mission profile operation due to its low computational burden and simple parameterization [15]- [22]. In previous studies, the lumped thermal network is either based on the transient thermal model [15]- [19], which includes all the transient thermal impedance, or the steady-state lumped thermal model [20]- [22], which only considers the thermal resistance. While this thermal stress modeling approach has been widely accepted in the previous studies, to the best knowledge of the authors, there is still a lack of validation in terms of modeling accuracy, especially when comparing the simulation results against the experimental thermal stress in field operations.…”
Section: Introductionmentioning
confidence: 99%