2020 IEEE Electrical Insulation Conference (EIC) 2020
DOI: 10.1109/eic47619.2020.9158690
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Life expectancy of high voltage bushings based on incipient failure detections: a practical approach

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Cited by 2 publications
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“…Despite the fact that the dielectric response methods are becoming more and more reliable, the interpretation of the obtained results is still difficult [9,[11][12][13][14]. This is mainly due to the fact that the bushing works as a parallel system of two elements located in different environments, and the measured dielectric response is their resultant.…”
Section: Introductionmentioning
confidence: 99%
“…Despite the fact that the dielectric response methods are becoming more and more reliable, the interpretation of the obtained results is still difficult [9,[11][12][13][14]. This is mainly due to the fact that the bushing works as a parallel system of two elements located in different environments, and the measured dielectric response is their resultant.…”
Section: Introductionmentioning
confidence: 99%