Lensless X-ray imaging in reflection geometry

Roy, Sujoy; Parks, Daniel; Seu, Keoki; Su, Run; Turner, Joshua J.; Chao, Weilun; Anderson, Erik H.; Cabrini, Stefano; Kevan, S. D.

doi:10.1038/nphoton.2011.11

Cited by 74 publications

(43 citation statements)

References 25 publications

(13 reference statements)

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“…2,35 The need for a finite support is particularly challenging to satisfy for reflection geometries, 36 which have therefore relied mostly on finite-beam-size methods such as ptychography. In contrast, our multiwavelength approach enables the imaging of large areas of extended samples in a reflection geometry (Figure 3a).…”

Section: Lensless Imaging In Reflectionmentioning

confidence: 99%

Lensless diffractive imaging with ultra-broadband table-top sources: from infrared to extreme-ultraviolet wavelengths

Witte¹,

Tenner

Noom³

et al. 2014

Light Sci Appl

101

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Lensless imaging is an approach to microscopy in which a high-resolution image of an object is reconstructed from one or more measured diffraction patterns, providing a solution in situations where the use of imaging optics is not possible. However, current lensless imaging methods are typically limited by the need for a light source with a narrow, stable and accurately known spectrum. We have developed a general approach to lensless imaging without spectral bandwidth limitations or sample requirements. We use two time-delayed coherent light pulses and show that scanning the pulse-to-pulse time delay allows the reconstruction of diffraction-limited images for all the spectral components in the pulse. In addition, we introduce an iterative phase retrieval algorithm that uses these spectrally resolved Fresnel diffraction patterns to obtain high-resolution images of complex extended objects. We demonstrate this two-pulse imaging method with octave-spanning visible light sources, in both transmission and reflection geometries, and with broadband extreme-ultraviolet radiation from a high-harmonic generation source. Our approach enables effective use of low-flux ultra-broadband sources, such as table-top high-harmonic generation systems, for high-resolution imaging.

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Section: Lensless Imaging In Reflectionmentioning

confidence: 99%

Lensless diffractive imaging with ultra-broadband table-top sources: from infrared to extreme-ultraviolet wavelengths

Witte¹,

Tenner

Noom³

et al. 2014

Light Sci Appl

101

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show abstract

“…13 Using reflection geometry for CDI at XUV wavelengths has several advantages. 13,20,21 The geometry was chosen because there are no easy-to-handle rigid substrates that are also transparent for XUV radiation. Therefore, transmission geometry is not feasible except when using very fragile ultra-thin silicon nitride membranes as sample holders.…”

Section: Methodsmentioning

confidence: 99%

Cancer cell classification with coherent diffraction imaging using an extreme ultraviolet radiation source

et al. 2014

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Abstract. In cancer treatment, it is highly desirable to classify single cancer cells in real time. The standard method is polymerase chain reaction requiring a substantial amount of resources and time. Here, we present an innovative approach for rapidly classifying different cell types: we measure the diffraction pattern of a single cell illuminated with coherent extreme ultraviolet (XUV) laser-generated radiation. These patterns allow distinguishing different breast cancer cell types in a subsequent step. Moreover, the morphology of the object can be retrieved from the diffraction pattern with submicron resolution. In a proof-of-principle experiment, we prepared single MCF7 and SKBR3 breast cancer cells on gold-coated silica slides. The output of a laser-driven XUV light source is focused onto a single unstained and unlabeled cancer cell. With the resulting diffraction pattern, we could clearly identify the different cell types. With an improved setup, it will not only be feasible to classify circulating tumor cells with a high throughput, but also to identify smaller objects such as bacteria or even viruses.

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“…In particular, by combining coherent, short-wavelength beams from either high harmonic generation (HHG) [10] or X-ray free electron lasers (XFELs) [11] with coherent diffractive imaging (CDI) [12][13][14][15], it is now possible to reach near-wavelength resolution imaging in the EUV and X-ray regions for the first time [16,17]. Accordingly, CDI has found a range of applications in transmission and reflection geometries [18][19][20] to investigate nanoscale strain [21,22], semiconductor structures [18], and for biological imaging [23][24][25]. EUV/X-ray CDI can be non-destructive and suffers no charging effects or resolution loss with depth.…”

Section: Introductionmentioning

confidence: 99%

Quantitative Chemically Specific Coherent Diffractive Imaging of Reactions at Buried Interfaces with Few Nanometer Precision

et al. 2016

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Characterizing buried layers and interfaces is critical for a host of applications in nanoscience and nano-manufacturing. Here we demonstrate non-invasive, non-destructive imaging of buried interfaces using a tabletop, extreme ultraviolet (EUV), coherent diffractive imaging (CDI) nanoscope. Copper nanostructures inlaid in SiO2 are coated with 100 nm of aluminum, which is opaque to visible light and thick enough that neither optical microscopy nor atomic force microscopy can image the buried interfaces. Short wavelength (29 nm) high harmonic light can penetrate the aluminum layer, yielding high-contrast images of the buried structures. Moreover, differences in the absolute reflectivity of the interfaces before and after coating reveal the formation of interstitial diffusion and oxidation layers at the Al-Cu and Al-SiO2 boundaries. Finally, we show that EUV CDI provides a unique capability for quantitative, chemically-specific imaging of buried structures, and the material evolution that occurs at these buried interfaces, compared with all other approaches.

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Lensless X-ray imaging in reflection geometry

Cited by 74 publications

References 25 publications

Lensless diffractive imaging with ultra-broadband table-top sources: from infrared to extreme-ultraviolet wavelengths

Lensless diffractive imaging with ultra-broadband table-top sources: from infrared to extreme-ultraviolet wavelengths

Cancer cell classification with coherent diffraction imaging using an extreme ultraviolet radiation source

Quantitative Chemically Specific Coherent Diffractive Imaging of Reactions at Buried Interfaces with Few Nanometer Precision

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