Le rendement de fluorescence

Burhop, E. H. S.

doi:10.1051/jphysrad:01955001607062500

Cited by 118 publications

(32 citation statements)

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“…A modification was proposed by Burhop (1955) to allow for screening and relativistic effects (see Bambynek et al, 1972): (o K /(1 À o K )) 1/4 ¼a+ bZ+gZ 3 . The term involving the constant a is essentially a correction for screening, while the term involving gZ 3 carries the relativistic correction (Fink et al, 1966).…”

Section: Methods and Resultsmentioning

confidence: 99%

K-shell fluorescence yields for elements with 6≤Z≤99

Kahoul

Abassi

Deghfel

et al. 2011

Radiation Physics and Chemistry

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Section: Methods and Resultsmentioning

confidence: 99%

K-shell fluorescence yields for elements with 6≤Z≤99

Kahoul

Abassi

Deghfel

et al. 2011

Radiation Physics and Chemistry

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“…To display our calculation graphically Figure 3 shows the empirical calculation (using formulae (1) and (3)) normalized to their corresponding theoretical calculations of McGuire [1] and the fitted values of Öz et al [2] and Hubbell et al [3] have been evaluated as a function of the atomic number Z. Despite the quite different procedures have been followed to calculate the average M-shell fluorescence yields, the obtained results are generally agree with the theoretical and fitted values in all the range of atomic number 70≤Z≤92 for the two methods (formulae (1) and (3)).…”

Section: Results and Descussionmentioning

confidence: 99%

“…It is noted from the above discussion that the present results can be used for analytical applications and more experimental and empirical determinations are needed to give more insights for the full knowledge of the average M-shell fluorescence yields. (1) and (3)) normalized to their corresponding theoretical calculations of McGuire [1] and the fitted values of Öz et al [2] and Hubbell et al [3] as function of the atomic number Z.…”

Section: Results and Descussionmentioning

confidence: 99%

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Average M shell fluorescence yields for elements with 70≤Z≤92

Kahoul¹,

Deghfel²,

Aylıkçı³

et al. 2015

AIP Conference Proceedings

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The theoretical, experimental and analytical methods for the calculation of average Mshell fluorescence yield ( M ω ) of different elements are very important because of the large number of their applications in various areas of physical chemistry and medical research. In this paper, the bulk of the average M-shell fluorescence yield measurements reported in the literature, covering the period 1955 to 2005 are interpolated by using an analytical function to deduce the empirical average M-shell fluorescence yield in the atomic range of 70≤Z≤92. The results were compared with the theoretical and fitted values reported by other authors. Reasonable agreement was typically obtained between our result and other works.

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“…This value O'in,i is used for calculation od Pi and Iin,i. The intensity of characteristic X-ray radiation Ich has an isotropic distribution [14]; it is given (in number of photons of given serie per incident electron per unit of solid angle) by formula Ich = Nia~h(O, where a~ is the fluorescence yield (calculated according to [15]) and O'h the ionisation cross section. Two models were incorporated in program for ionisation cross section calculation: Grzyzinski's model (G) [16], ach,6 = aO 1 + ~ In and Powell's model [10] (6a)…”

Section: Models Used For MCCmentioning

confidence: 99%

Signal-to-background in EPMA: Measurement and Monte Carlo calculation

Starý

1994

Mikrochim Acta

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Abstract. By the method of Monte Carlo calculation, the dependence of the signal-to-background ratio of detected X-rays on the energy of electrons as well as on the thickness of the sample was calculated. The range of energy was 40 -120 keV, the range of thickness was approximately 8 -80 #g/cm 2 (40 -400 nm at density p = 2 g/cm3). The results were compared with measurements in electron microscope on thin resin standard for biological microanalysis. The measured dependence of signal-to-background ratio on the energy of electrons has the maximum at 80 keV, the calculated one changes at increased thickness from a monotonic form to one with a maximum at a particular thickness. The absolute values (Hall correction procedure was used for measured values) differs mainly at the highest energy used (120 keV); the difference is probably caused by unproper correction of measured value of background at this energy. Simultaneously, the source distribution of emitted X-ray photons is calculated. Its knowledge gives the possibility to estimate simply the interaction volume diameter and, by this way, to determine the spatial resolution of electron probe X-ray microanalysis.Key words: electron probe, X-ray microanalysis, electron scattering simulation, X-ray production, biological thin sections.In electron probe X-ray microanalysis (EPMA) Monte Carlo methods (MCC) are currently used for calculation of electron scattering [1,2] as well as of intensity of emitted X-ray radiation [3,4]. MCC gives the possibility to calculate and estimate the non-or hardly measurable parameters, influencing the results of analyses (e.g., the size of interaction volume, the X-ray lateral and depth distribution, the backscatter coefficient, etc). Usually, the correctness of the model and the accuracy of calculations of some parameters, at least those easily measurable, would be checked by experiment.

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Le rendement de fluorescence

Cited by 118 publications

References 0 publications

K-shell fluorescence yields for elements with 6≤Z≤99

K-shell fluorescence yields for elements with 6≤Z≤99

Average M shell fluorescence yields for elements with 70≤Z≤92

Signal-to-background in EPMA: Measurement and Monte Carlo calculation

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