2008
DOI: 10.1117/12.796235
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Layered III-VI chalcogenide semiconductor crystals for radiation detectors

Abstract: The layered anisotropic chalcogenide semiconductors GaSe and GaTe single crystals have been grown by a modified vertical Bridgman technique using high purity Ga (7N) and in-house zone refined (ZR) precursor materials (Se and Te). The crystals harvested from ingots of up to 10 cm length and up to 2" diameter, have been characterized by measuring resistivity through current-voltage (I-V) characteristics and bulk carrier concentration and mobility through Hall effect measurements. Micro-hardness, infrared microsc… Show more

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Cited by 8 publications
(3 citation statements)
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“…Sample preparation. GaSe nanoslabs are mechanically exfoliated from a Bridgman grown GaSe crystal 37 and deposited onto a 90-nm SiO 2 /Si substrate. The samples studied in this study are mainly the modifications.…”
mentioning
confidence: 99%
“…Sample preparation. GaSe nanoslabs are mechanically exfoliated from a Bridgman grown GaSe crystal 37 and deposited onto a 90-nm SiO 2 /Si substrate. The samples studied in this study are mainly the modifications.…”
mentioning
confidence: 99%
“…Experiment. Nanometer thick GaSe crystals are mechanically exfoliated from a Bridgman-grown crystal with unintentionally p-doped concentration 10 14 − 10 15 cm −3 [33] and deposited onto a silicon substrate with a 90 nm SiO 2 layer. Sample thickness is measured by atomic force microscopy.…”
mentioning
confidence: 99%
“…Sample preparation and experimental measurement methods were described previously 12 . Thin films of GaSe crystals were mechanically exfoliated from a Bridgmangrown crystal 26 and deposited onto a silicon substrate with a 90 nm SiO 2 layer, with the thickness measured using atomic force microscopy. Samples were mounted in vacuum on a copper cold finger attached to an optical liquid helium flow cryostat for all experiments.…”
Section: Resultsmentioning
confidence: 99%