2016
DOI: 10.1103/physrevb.93.075440
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Layer-dependent anisotropic electronic structure of freestanding quasi-two-dimensionalMoS2

Abstract: The anisotropy of the electronic transition is a well-known characteristic of low-dimensional transition-metal dichalcogenides, but their layer-thickness dependence has not been properly investigated experimentally until now. Yet, it not only determines the optical properties of these low-dimensional materials, but also holds the key in revealing the underlying character of the electronic states involved. Here we used both angle-resolved electron energy-loss spectroscopy and spectral analysis of angle-integrat… Show more

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Cited by 33 publications
(31 citation statements)
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References 43 publications
(105 reference statements)
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“…These ions are expected to originate from water molecules that have been split by the catalytic effect of MoS 2 to water 43–45. This is in line with other reports where the layered crystal structure of MoS 2 and the associated anisotropic electronic properties facilitate ion transport along the layers 28,46,47…”
Section: Resultssupporting
confidence: 88%
“…These ions are expected to originate from water molecules that have been split by the catalytic effect of MoS 2 to water 43–45. This is in line with other reports where the layered crystal structure of MoS 2 and the associated anisotropic electronic properties facilitate ion transport along the layers 28,46,47…”
Section: Resultssupporting
confidence: 88%
“…2(a) and 3 of Ref. [39] which demonstrate that EELS spectra decrease as in-plane component of momentum transfer (q y ) increases (which is analogous with increasing incident angle).…”
Section: B Angle-resolved Optical Absorption and Transmissionmentioning
confidence: 71%
“…This is consistent with the selection rules related to optical processes for non-zero values of the momentum and with the exciton dispersion predicted for BP and other 2D materials. 32,33 Now, we focus on the dispersion of the plasmonic contributions, which is characterized by a maximum intensity at 19.3 eV (for q = 0 Å -1 ), using the TEM in-column energy filter to record the scattering pattern at fixed energies (EFSP). Figure 3b shows the intensity repartition of the dielectric function as a function of momentum and direction for fixed values of energy.…”
Section: Dispersions Of Plasmonsmentioning
confidence: 99%