Advances in Chemical Mechanical Planarization (CMP) 2022
DOI: 10.1016/b978-0-12-821791-7.00004-6
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Latest developments in the understanding of PVA brush related issues during post CMP (pCMP) cleaning

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Cited by 2 publications
(3 citation statements)
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“…Their key characteristic is excellent water absorption and retention, ensuring steady solvent delivery to the wafer surface and enhancing residue removal. 78 The manufacturing of PVA brushes is a multistep process. 73 It begins with dissolving hydrolyzed poly(vinyl alcohol) in water under sustained heat (85−90 °C) and stirring.…”
Section: Cmp Padsmentioning
confidence: 99%
See 1 more Smart Citation
“…Their key characteristic is excellent water absorption and retention, ensuring steady solvent delivery to the wafer surface and enhancing residue removal. 78 The manufacturing of PVA brushes is a multistep process. 73 It begins with dissolving hydrolyzed poly(vinyl alcohol) in water under sustained heat (85−90 °C) and stirring.…”
Section: Cmp Padsmentioning
confidence: 99%
“…Polyvinyl acetal (PVA) brushes are designed for the effective removal of particles and contaminants from wafer surfaces. Their key characteristic is excellent water absorption and retention, ensuring steady solvent delivery to the wafer surface and enhancing residue removal …”
Section: Manufacturing Process Of Cmp Consumables and Their Possible ...mentioning
confidence: 99%
“…13 Thus, well-designed post-polish CMP cleaning has become a crucial step to eliminate many of these defects. 50 Organic compounds such as stabilizers, dispersants, complexing agents, passivation agents, etc., are added to most commercial ceriabased CMP slurries to achieve long-term stability and the required CMP performance. Chemical adsorption of these organic additives at the ceria surface occurs through the contributions of electrostatic, H-bonding, and van der Waals interactions.…”
Section: Future Research Needs and Prospectsmentioning
confidence: 99%