2004
DOI: 10.1063/1.1638898
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Lateral homogeneity of Schottky contacts on n-type ZnO

Abstract: The electrical properties of Schottky contacts (SCs) produced ex situ on n-type ZnO single crystals and epitaxial thin films were investigated. Electron beam induced current imaging was used to study lateral variations of the current induced in the space charge region of the SC. Further, the effective barrier height was determined by current–voltage and capacitance–voltage measurements. Pd contacts prepared on ZnO thin films that had undergone treatment in a plasma-enhanced chemical vapor deposition with nitro… Show more

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Cited by 114 publications
(55 citation statements)
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“…The central axis of the nanowire remained neutral. In addition to Pt, ZnO has been reported to form Schottky diodes with a variety of metals, such as Ag [532], Au [533], Pd [534], and Ni [534]. Surface treatment can effectively improve the diode performance [535,536].…”
Section: Atomic Force Microscopy-based Nanogeneratorsmentioning
confidence: 99%
“…The central axis of the nanowire remained neutral. In addition to Pt, ZnO has been reported to form Schottky diodes with a variety of metals, such as Ag [532], Au [533], Pd [534], and Ni [534]. Surface treatment can effectively improve the diode performance [535,536].…”
Section: Atomic Force Microscopy-based Nanogeneratorsmentioning
confidence: 99%
“…In particular, fabrication of stable and rectifying metal contacts to ZnO remains a challenge despite numerous recent investigations. [1][2][3][4][5][6][7][8][9][10][11][12] A number of studies have addressed various possible fundamental mechanisms affecting Schottky barrier ͑SB͒ performance in ZnO, 1,5,9-13 but none have considered the role of both the surface and subsurface. Thus, while several studies have proposed that surface morphology, hydroxide ͑OH͒, and carbon surface contamination play a dominant role, none have considered the role of subsurface defects and impurities that could alter local carrier concentrations, depletion widths, and tunneling.…”
mentioning
confidence: 99%
“…where A is the active contact area (110 × 10 −6 m 2 ), A* is the Richardson constant, which has a theoretical value of 32 A cm −2 K −2 for ZnO [30] and b is the Schottky barrier height. The value of I s is obtained from the extrapolated intercept of ln I versus V plot ( The ideality factor (n) and series resistance (R s ) of Schottky contacts can be obtained from following equations using the Cheung method [31]: Figure 6 shows variation of dV/d(lnI) versus I at different temperatures from which the value of n can be obtained from the intercept at the zero current axis equating to (nkT/q) in a linear fit of lower voltage region I.…”
Section: Resultsmentioning
confidence: 99%