We have measured the diffusion of deuterated polystyrene of molecular weight 90 3 10 3 in various matrices of hydrogenated polystyrene as a function of distance from an attractive interface, oxide-covered silicon. Surprisingly long-range effects are observed. Diffusion rates an order of magnitude slower than bulk persist up to 10R g (radius of gyration) from the interface of either the diffusant or matrix polymers. The slowdown is independent of matrix molecular weight over a broad range. However, mixing of polymers within the matrix strongly influences the rates of diffusion.[S0031-9007(97)

A conversion from ohmic to rectifying behavior is observed for Au contacts on atomically ordered polar ZnO surfaces following remote, room-temperature oxygen plasma treatment. This transition is accompanied by reduction of the “green” deep level cathodoluminescence emission, suppression of the hydrogen donor-bound exciton photoluminescence and a ∼0.75eV increase in n-type band bending observed via x-ray photoemission. These results demonstrate that the contact type conversion involves more than one mechanism, specifically, removal of the adsorbate-induced accumulation layer plus lowered tunneling due to reduction of near-surface donor density and defect-assisted hopping transport.

The authors used depth-resolved cathodoluminescence spectroscopy and current-voltage measurements to probe metal-ZnO diodes as a function of native defect concentration, oxygen plasma processing, and metallization. The results show that resident native defects in ZnO single crystals and native defects created by the metallization process dominate metal-ZnO Schottky barrier heights and ideality factors. Results for ZnO(0001¯) faces processed with room temperature remote oxygen plasmas to remove surface adsorbates and reduce subsurface native defects demonstrate the pivotal importance of crystal growth quality and metal-ZnO reactivity in forming near-interface states that control Schottky barrier properties.

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We have measured the Flory−Huggins interaction parameter (χ) for blends of polystyrene (PS) and poly(4-vinylpyridine) (P4VP) by three different methods. First, we measured the micelle spacings in microphase-separated films of PS−P4VP diblock copolymers by secondary ion mass spectrometry and atomic force microscopy. Second, we measured the contact angle of droplets of homopolymer PS on P4VP homopolymer film. Finally we determined the interfacial width between homopolymer layers of dPS and P4VP by neutron reflectometry. From each of these experiments χ was calculated using mean field theory in the strong segregation limit. These values of χ are much larger than those of other nonionic polymer pairs. We discuss the importance of this findings.