2001
DOI: 10.1021/la000650g
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Lateral Force Microscopy Study of the Frictional Behavior of Self-Assembled Monolayers of Octadecyltrichlorosilane on Silicon/Silicon Dioxide Immersed in n-Alcohols

Abstract: Lateral force microscopy (LFM) was used to evaluate the frictional behavior of surfaces modified with self-assembled monolayers (SAMs) and immersed in n-alcohols (CH3(CH2)xOH where x ) 0-8,11) as a function of applied normal load, sliding velocity, and solvent chain length. SAMs were formed from octadecyltrichlorosilane (OTS) on silicon/silicon dioxide substrates. The objective was to investigate how the solvent environment affected the frictional behavior of OTS and to characterize the effectiveness of OTS as… Show more

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Cited by 61 publications
(60 citation statements)
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“…Consequently, we selected SAMs of OTS that were immersed in n-alcohols, nϭ1 -12, as a model system for a LFM study of the effects of sliding velocity, solvent chain length and applied normal load on the friction behavior of SAMs of alkylsiloxanes. 12 Maxima in the friction force occurred as a function of sliding velocity for applied normal loads of ϳ20-40 nN and n ϭ2 -9. These maxima shifted to lower sliding velocity with increasing n and increasing applied normal load.…”
Section: Introductionmentioning
confidence: 94%
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“…Consequently, we selected SAMs of OTS that were immersed in n-alcohols, nϭ1 -12, as a model system for a LFM study of the effects of sliding velocity, solvent chain length and applied normal load on the friction behavior of SAMs of alkylsiloxanes. 12 Maxima in the friction force occurred as a function of sliding velocity for applied normal loads of ϳ20-40 nN and n ϭ2 -9. These maxima shifted to lower sliding velocity with increasing n and increasing applied normal load.…”
Section: Introductionmentioning
confidence: 94%
“…Scanning and fluid cell procedures are described elsewhere. 12 Force-displacement curves were obtained at each setpoint voltage for the vertical deflection of the cantilever to determine the normal load applied to the sample. The raw voltage data was converted with Hooke's law for small cantilever deflections as described elsewhere.…”
Section: Scanning Force Microscopymentioning
confidence: 99%
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