Laser testing of a double-access BBICS architecture with improved SEE detection capabilities

Champeix, Clement; Dutertre, Jean-Max; Pouget, Vincent; Robisson, Bruno; Lisart, Mathieu; Borrel, Nicolas; Sarafianos, Alexandre

doi:10.1109/radecs.2016.8093172

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

hi@scite.ai

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

Laser testing of a double-access BBICS architecture with improved SEE detection capabilities

Abstract: The paper reports the experimental validation of a new Bulk Built-In Current Sensor (BBICS) designed and implemented in a 40nm CMOS technology. The double-access architecture provides improved SEE detection as confirmed by laser experiments.

Cited by 4 publications

References 12 publications

Architectures of Body Built-In Current Sensors for Detection of Transient Faults

Architectures of Body Built-In Current Sensors for Detection of Transient Faults

Integrating pulsed laser for a galvo mirror based SEE scanning microscope with optical failure analysis capabilities

Sensitivity to Laser Fault Injection: CMOS FD-SOI vs. CMOS Bulk

Contact Info

Product

Resources

About