Laser-induced crystallization of calcium phosphate coatings on polyethylene (PE)

Feddes, B.; Vredenberg, A. M.; Wehner, Martin; Wolke, Joop C.G.; Jansen, John A.

doi:10.1016/j.biomaterials.2004.07.002

Cited by 16 publications

(16 citation statements)

References 31 publications

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“…In previous work 4 we found a strong chemical interaction between the deposited CaP coating and the polymeric substrate. This reactivity is induced by the breakage of bonds at the polymeric surface due to energetic bombardment during the deposition process.…”

Section: Discarding the C And O Datamentioning

confidence: 97%

“…4), as we found previously. 4 The graph on the right in Fig. 4 gives the expected XPS yield versus coverage for both the flat Ca profile and the increasing Ca profile.…”

Section: Influence Of P and Ca Concentration Profilesmentioning

confidence: 98%

“…In previous work 4 we measured the P and Ca profile near the interface by using XPS and RBS. The broadest concentration profile was found for Ca.…”

Section: Influence Of P and Ca Concentration Profilesmentioning

confidence: 99%

“…In this paper, we measure the XPS yield of samples with an increasing and known CaP coating thickness d, in order to verify relations (3) and (4). From the XPS yield Y X versus thickness (d) plot, we find the AL E X for the different XPS peaks.…”

Section: Introductionmentioning

confidence: 99%

“…In recent work, we have focused on the bonding nature of a CaP coating with its underlying substrate. 4 Our goal is to understand and improve the adhesion of CaP coatings on metallic and polymeric substrates. Such coated substrates are used as a basis for medical implants.…”

Section: Introductionmentioning

confidence: 99%

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Determination of photoelectron attenuation lengths in calcium phosphate ceramic films using XPS and RBS

Feddes¹,

Vredenberg

Wolke

et al. 2003

Surface & Interface Analysis

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Calcium phosphate (CaP) coatings are used to improve the biological performance of an implant. A technique that is often used to measure the composition of this material is XPS. When extremely thin coatings are measured, for example to study the interface between CaP and a substrate, the quantification of the XPS results is complicated by the varying attenuation lengths (ALs) of the photoelectrons at different energies. To correct for this, AL data are needed. In this work we measured these ALs by comparing XPS yields with the coating coverage (as measured by Rutherford backscattering spectrometry). We were able to determine the AL for several calcium and phosphorus peaks. Determination of the oxygen ALs was not possible owing to diffusion of oxygen into the polymeric substrates. For the peaks that are most often used for quantification of XPS yields (the Ca 2p and the P 2p peak), we found ALs of 21.8 × 10

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Section: Discarding the C And O Datamentioning

confidence: 97%

“…4), as we found previously. 4 The graph on the right in Fig. 4 gives the expected XPS yield versus coverage for both the flat Ca profile and the increasing Ca profile.…”

Section: Influence Of P and Ca Concentration Profilesmentioning

confidence: 98%

“…In previous work 4 we measured the P and Ca profile near the interface by using XPS and RBS. The broadest concentration profile was found for Ca.…”

Section: Influence Of P and Ca Concentration Profilesmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 3 more Smart Citations

Determination of photoelectron attenuation lengths in calcium phosphate ceramic films using XPS and RBS

Feddes¹,

Vredenberg

Wolke

et al. 2003

Surface & Interface Analysis

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Influence of the Chemical Composition on the Phase Constitution and the Elastic Properties of RF‐Sputtered Hydroxyapatite Coatings

Snyders

Bousser

Mušić

et al. 2008

Plasma Processes & Polymers

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We have studied the influence of chemical composition on the constitution and elastic properties of dense radio‐frequency (RF)‐sputtered hydroxyapatite (HA) coatings. The chemical composition was modified by varying the RF sputtering power density (PD). As the PD was increased by 240%, the Ca/P ratio measured by X‐ray photoelectron spectroscopy increased from ≈1.51 to ≈1.82. X‐ray diffraction indicates phase pure hexagonal HA except for the sample prepared at the highest PD where CaO and Ca3(PO4)2 also form. Deviations from the stoichiometric Ca/P ratio result in reduction of the elastic modulus. For Ca/P = 1.51 ± 0.02, the elastic modulus decreases by ≈15%. This may be due to incorporation of Ca vacancies in the lattice, while for Ca/P = 1.82 ± 0.02, the average elastic modulus decreases by ≈10% due to formation of additional phases.

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Pulsed Laser Deposition of Thin Calcium Phosphate Coatings

León

2008

Thin Calcium Phosphate Coatings for Medical Implants

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Laser-induced crystallization of calcium phosphate coatings on polyethylene (PE)

Cited by 16 publications

References 31 publications

Determination of photoelectron attenuation lengths in calcium phosphate ceramic films using XPS and RBS

Determination of photoelectron attenuation lengths in calcium phosphate ceramic films using XPS and RBS

Influence of the Chemical Composition on the Phase Constitution and the Elastic Properties of RF‐Sputtered Hydroxyapatite Coatings

Pulsed Laser Deposition of Thin Calcium Phosphate Coatings

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