Abstract:Calcium phosphate (CaP) coatings are used to improve the biological performance of an implant. A technique that is often used to measure the composition of this material is XPS. When extremely thin coatings are measured, for example to study the interface between CaP and a substrate, the quantification of the XPS results is complicated by the varying attenuation lengths (ALs) of the photoelectrons at different energies. To correct for this, AL data are needed. In this work we measured these ALs by comparing XP… Show more
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