2015
DOI: 10.1016/j.apsusc.2015.04.200
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Laser-assisted atom probe tomography of 15N-enriched nitride thin films for analysis of nitrogen distribution in silicon-based structure

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Cited by 10 publications
(10 citation statements)
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“…However, by replacing 14 N with 15 N, most overlaps in the mass spectrum can be avoided without making any significant change to the chemistry of the material. A similar study on FeN enriched in 15 N by Sha et al [26], and more recent studies of isotopic enrichment in SiO2 and SiN using 18 O and 15 N by Kinno et al [27,28], have been conducted. In this paper, we show that the most abundant isotopes of Si and N can be separated in the APT mass spectrum using TiSi 15 N thin solid films produced by cathodic arc deposition.…”
Section: Introductionmentioning
confidence: 80%
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“…However, by replacing 14 N with 15 N, most overlaps in the mass spectrum can be avoided without making any significant change to the chemistry of the material. A similar study on FeN enriched in 15 N by Sha et al [26], and more recent studies of isotopic enrichment in SiO2 and SiN using 18 O and 15 N by Kinno et al [27,28], have been conducted. In this paper, we show that the most abundant isotopes of Si and N can be separated in the APT mass spectrum using TiSi 15 N thin solid films produced by cathodic arc deposition.…”
Section: Introductionmentioning
confidence: 80%
“…2 (a). Peaks of particular interest, such as 15 N + , 15 N 2 + , 15 N 2 2+ , 28 Si + , 28 Si 2+ , and 28 Si 15 N 2 2+ , as well as the isotopic signature of Ti 2+ , Ti 3+ , and Ti 15 N 2+ , have been tagged. The Ti and TiN isotopic signatures consist of five visible peaks each, where the center peak is significantly larger than the surrounding four.…”
Section: Apt Mass Spectramentioning
confidence: 99%
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