2007
DOI: 10.1002/pip.758
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Laser ablation of SiO2 for locally contacted Si solar cells with ultra‐short pulses

Abstract: We apply ultra‐short pulse laser ablation to create local contact openings in thermally grown passivating SiO2 layers. This technique can be used for locally contacting oxide passivated Si solar cells. We use an industrially feasible laser with a pulse duration of τpulse ∼ 10 ps. The specific contact resistance that we reach with evaporated aluminium on a 100 Ω/sq and P‐diffused emitter is in the range of 0·3–1 mΩ cm2. Ultra‐short pulse laser ablation is sufficiently damage free to abandon wet chemical etching… Show more

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Cited by 88 publications
(42 citation statements)
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“…The ''selective'' emitter (SE) concept uses laterally different emitter doping: (i) high doping under the front side metallization for low contact resistance between contact metal and semiconductor interface, (ii) lower doping between the contact fingers for a better short wavelength response due to less Auger recombination [1] as well as improved emitter passivation [2,3]. Unfortunately, most SE concepts developed so far in research imply a high process complexity due to the required masking steps for selective diffusion [4] or emitter etch back [5]. In particular, such existing concepts are hard to implement into industrial production of solar cells.…”
Section: Introductionmentioning
confidence: 99%
“…The ''selective'' emitter (SE) concept uses laterally different emitter doping: (i) high doping under the front side metallization for low contact resistance between contact metal and semiconductor interface, (ii) lower doping between the contact fingers for a better short wavelength response due to less Auger recombination [1] as well as improved emitter passivation [2,3]. Unfortunately, most SE concepts developed so far in research imply a high process complexity due to the required masking steps for selective diffusion [4] or emitter etch back [5]. In particular, such existing concepts are hard to implement into industrial production of solar cells.…”
Section: Introductionmentioning
confidence: 99%
“…This contact diffusion in region 4 is equivalent to a sheet resistance value of 20 Ω/sq. As discussed elsewhere [8,11,12], we also have an alternative technique available for achieving virtually damage-free openings in the SiO 2 layer by using an ultra short pulse picosecond laser. This technology avoids any need for damage etching after opening SiO 2 layers and therefore provides process flexibility as well as a simplification of the process sequence.…”
Section: Contributedmentioning
confidence: 99%
“…The average effective minority carrier lifetime (t eff ) is measured by means of microwave-induced photo-conductance decay (MW-PCD) at the injection level of about 10 16 atoms/cm 3 . The SE1 cell shows lower average lifetime, LBIC and contact resistance which is mainly due to the laser-induced defect and increasing minority carrier recombination [8]. It is worth noting that the contact resistance for the SE1 cell could be also affected in this experiment.…”
mentioning
confidence: 92%