Large take-off angle dependence of C-K emission spectra observed in highly oriented pyrolytic graphite

Niibe, Masahito; Tokushima, Takashi; Takehira, Noritaka; Araki, Yuma

doi:10.1016/j.elspec.2017.02.001

Cited by 6 publications

(4 citation statements)

References 11 publications

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“…The positional relation of these peaks on the energy axis and the takeoff angle dependence of the satellite peak are very similar to those of the C-K emission spectrum of HOPG reported previously [14]. From this, it can be inferred that the doped B atom is incorporated into the carbon hexagonal network structure of HOPG by replacing it with a C atom.…”

Section: Resultssupporting

confidence: 66%

Electronic Structure of Boron Doped HOPG: Selective Observation of Carbon and Trace Dope Boron by Means of X-ray Emission and Absorption Spectroscopy

Niibe

Takehira

Tokushima

2018

e-J. Surf. Sci. Nanotech.

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We have measured the soft X-ray absorption and emission spectra of near B-K and C-K absorption edges of highly oriented pyrolytic graphite (HOPG) doped with a small amount (0.32 at.%) of boron (B), including incident/takeoff angle dependence.The main peak intensities at the B-K edge around 182 eV were almost independent on the change of takeoff angle. On the other hand, the satellite peak around 185 eV becomes larger as the takeoff angle becomes smaller. Based on this result, unlike the previous assignment of the main peak predicted from the quantum chemical calculation (π orbitals), it is reasonable to attribute the main peak to the σ orbitals. The takeoff angle dependence of the B-K emission is similar to the angle dependency of the C-K emission of undoped HOPG. Based on this and the theoretical consideration, it is presumable that the doped B atom does not intercalate between the layers of HOPG; it replaces the C atom of the hexagonal network structure and has a wave function similar to that of C atoms (sp 2 type hybridized orbital).

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Section: Resultssupporting

confidence: 66%

Electronic Structure of Boron Doped HOPG: Selective Observation of Carbon and Trace Dope Boron by Means of X-ray Emission and Absorption Spectroscopy

Niibe

Takehira

Tokushima

2018

e-J. Surf. Sci. Nanotech.

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“…From the XES of the incident angles of 20°, 45°, and 70°(not indicated in this paper), the incident-angle dependence was weaker than HOPG. 63) It is found that the graphite flakes in the graphite-like film randomly oriented because the degree of preferentially orientation of low weight molecules such as Pn, DHP, and PO was low as shown in Figs. 4 and 5.…”

Section: Resultsmentioning

confidence: 95%

Soft X-ray absorption and emission spectra of nanographene prepared from pentacene with hot mesh deposition and soft X-ray irradiation

Heya¹,

Niibe²,

Kanda³

et al. 2021

Jpn. J. Appl. Phys.

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The molecular orientation and partial density of states were evaluated using NewSUBARU by soft X-ray absorption spectroscopy (XAS) and soft X-ray emission spectroscopy measurements. The degree of molecular alignment was degraded by increasing mesh temperature in hot mesh deposition (HMD), in other words, was changed from pentacene (Pn) to 6,13-dihydropentacene (DHP). At a mesh temperature of 1450 °C, the different XAS was obtained due to the mixing effect of Pn and DHP, and presence of Pn oligomer. The HMD carbon film transformed into the graphite-like film and the graphene on the quartz substrate and the Ni/quartz substrate after soft X-ray irradiation, respectively. The HMD carbon film after soft X-ray irradiation showed the peaks due to terminal carbon such as CH n and COOH in comparison with the reported large graphene sheet. It indicates that the flake size of the graphene on the Ni/quartz substrate was small and had many edges.

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“…The anisotropic C Kα emission band originating from HOPG constitutes an efficient test to probe the spectral resolution of a specific dispersive device or an entire spectrometer [25,26]. We take advantage of the improved resolution when operating the EM at the 2nd diffraction order to evidence the slight modifications of the shape of the C Kα band as a function of the angle δ between the emission direction and the orientation of the (0 0 0 1) planes (or take-off angle).…”

Section: -P5mentioning

confidence: 99%

“…• with a grating spectrometer by Terauchi et al [25] and very recently by Niibe et al [26]. The three spectra are aligned according to the position of their maximal intensity.…”

Section: -P5mentioning

confidence: 99%

Design, development and applications of etched multilayers for soft X-ray spectroscopy

Guen

Benbalagh

André

et al. 2017

Eur. Phys. J. Appl. Phys.

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Abstract. An etched multilayer, a 2D structure fabricated by etching a periodic multilayer according to the pattern of a laminar grating, is applied in the soft X-ray range to improve the spectral resolution of wavelength dispersive spectrometers. The present article gathers all the successive stages of the development of such a device optimized to analyze the characteristic emission of light elements: design, structural and optical characterization and applications to X-ray spectroscopy. The evolution of the shape of the C Kα emission band of highly oriented pyrolytic graphite (HOPG), as a function of the angle between the emission direction and the (0 0 0 1) planes, is measured. These results, compared to those with a grating, demonstrate that the achieved spectral resolution enables disentangling σ → 1s and π → 1s transitions within the C K emission band.

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Large take-off angle dependence of C-K emission spectra observed in highly oriented pyrolytic graphite

Cited by 6 publications

References 11 publications

Electronic Structure of Boron Doped HOPG: Selective Observation of Carbon and Trace Dope Boron by Means of X-ray Emission and Absorption Spectroscopy

Electronic Structure of Boron Doped HOPG: Selective Observation of Carbon and Trace Dope Boron by Means of X-ray Emission and Absorption Spectroscopy

Soft X-ray absorption and emission spectra of nanographene prepared from pentacene with hot mesh deposition and soft X-ray irradiation

Design, development and applications of etched multilayers for soft X-ray spectroscopy

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