Label-free multi-photon imaging using a compact femtosecond fiber laser mode-locked by carbon nanotube saturable absorber

Kieu, Khanh; Mehravar, Soroush; Gowda, Raghu; Norwood, Robert A.; Peyghambarian, N.

doi:10.1364/boe.4.002187

Cited by 63 publications

(43 citation statements)

References 36 publications

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“…The design of the microscope, and the experimental procedure have been reported previously. 21,22 The light source in the system is an amplified erbium-doped mode-locked fiber laser operating at a central wavelength of 1560 nm. The maximum average power of the laser is 60 mW with a repetition rate of 75 MHz and 228 fs pulse duration at the sample surface.…”

Section: -mentioning

confidence: 99%

Second and third harmonic generation in few-layer gallium telluride characterized by multiphoton microscopy

Susoma

Karvonen

Säynätjoki

et al. 2016

Applied Physics Letters

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We report on the nonlinear optical properties of few-layer GaTe studied by multiphoton microscopy. Second and third harmonic generation from few-layer GaTe flakes were observed in this study with the laser pump wavelength of 1560 nm. These processes were found to be sensitive to the number of GaTe layers. The second- and third-order nonlinear susceptibilities of 2.7 × 10−9 esu (1.15 pm/V) and 1.4 × 10−8 esu (2 × 10−16 m2/V2) were estimated, respectively.

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Section: -mentioning

confidence: 99%

Second and third harmonic generation in few-layer gallium telluride characterized by multiphoton microscopy

Susoma

Karvonen

Säynätjoki

et al. 2016

Applied Physics Letters

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“…Additionally, the laser used should be capable of performing MPM and OCM using the same optical system. It was previously demonstrated that OCM and MPM can be performed using a compact ultrafast femtosecond fiberbased supercontinuum source 5,6 . Using such supercontinuum sources is much more effective both in space and price, but presents a challenge to the dichroic coatings since the bands that should be reflected and transmitted are wider.…”

Section: Previous Designsmentioning

confidence: 99%

Full optical model of micro-endoscope with optical coherence microscopy, multiphoton microscopy and visible capabilities.

Vega

Kiekens

Syson

et al. 2018

Endoscopic Microscopy XIII

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While Optical Coherence Microscopy (OCM), Multiphoton Microscopy (MPM), and narrowband imaging are powerful imaging techniques that can be used to detect cancer, each imaging technique has limitations when used by itself. Combining them into an endoscope to work in synergy can help achieve high sensitivity and specificity for diagnosis at the point of care. Such complex endoscopes have an elevated risk of failure, and performing proper modelling ensures functionality and minimizes risk. We present full 2D and 3D models of a multimodality optical micro-endoscope to provide real-time detection of carcinomas, called a salpingoscope. The models evaluate the endoscope illumination and light collection capabilities of various modalities. The design features two optical paths with different numerical apertures (NA) through a single lens system with a scanning optical fiber. The dual path is achieved using dichroic coatings embedded in a triplet. A high NA optical path is designed to perform OCM and MPM while a low NA optical path is designed for the visible spectrum to navigate the endoscope to areas of interest and narrowband imaging. Different tests such as the reflectance profile of homogeneous epithelial tissue were performed to adjust the models properly. Light collection models for the different modalities were created and tested for efficiency. While it is challenging to evaluate the efficiency of multimodality endoscopes, the models ensure that the system is design for the expected light collection levels to provide detectable signal to work for the intended imaging.

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“…In order to visualize the difference in optical properties between transferred and directly grown graphene we employed nonlinear microscopy technique. We used a multiphoton femtosecond microscope [12][13][14] introduced schematically in Fig. 3.…”

Section: Sample Preparationmentioning

confidence: 99%

Optical characterization of directly deposited graphene on a dielectric substrate

Kaplas¹,

Karvonen²,

Ahmadi³

et al. 2016

Opt. Express

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By using scanning multiphoton microscopy we compare the nonlinear optical properties of the directly deposited and transferred to the dielectric substrate graphene. The direct deposition of graphene on oxidized silicon wafer was done by utilizing sacrificial copper catalyst film. We demonstrate that the directly deposited graphene and bi-layered transferred graphene produce comparable third harmonic signals and have almost the same damage thresholds. Therefore, we believe directly deposited graphene is suitable for the use of e.g. nanofabricated optical setups. Lipsanen, and K. Kieu, "Rapid large-area multiphoton microscopy for characterization of graphene," ACS Nano 7(10), 8441-8446 (2013). 13. K. Kieu, S. Mehravar, R. Gowda, R. A. Norwood, and N. Peyghambarian, "Label-free multi-photon imaging using a compact femtosecond fiber laser mode-locked by carbon nanotube saturable absorber," Biomed. Opt. Express 4(10), 2187-2195 (2013). 14. L. Karvonen, A. Säynätjoki, S. Mehravar, R. D. Rodriguez, S. Hartmann, D. R. T. Zahn, S. Honkanen, R. A.Norwood, N. Peyghambarian, K. Kieu, H. Lipsanen, and J. Riikonen, "Investigation of second-and thirdharmonic generation in few-layer gallium selenide by multiphoton microscopy," Sci. Rep. 5, 10334 (2015). #253966

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Label-free multi-photon imaging using a compact femtosecond fiber laser mode-locked by carbon nanotube saturable absorber

Cited by 63 publications

References 36 publications

Second and third harmonic generation in few-layer gallium telluride characterized by multiphoton microscopy

Second and third harmonic generation in few-layer gallium telluride characterized by multiphoton microscopy

Full optical model of micro-endoscope with optical coherence microscopy, multiphoton microscopy and visible capabilities.

Optical characterization of directly deposited graphene on a dielectric substrate

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