2013
DOI: 10.1002/pip.2445
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Junction formation by Zn(O,S) sputtering yields CIGSe-based cells with efficiencies exceeding 18%

Abstract: In an effort to reduce the complexity and associated production costs of Cu(In,Ga)Se 2 (CIGSe)-based solar cells, the commonly used sputtered undoped ZnO layer has been modified to eliminate the requirement for a dedicated buffer layer. After replacing the ZnO target with a mixed ZnO/ZnS target, efficient solar cells could be prepared by sputtering directly onto the as-grown CIGSe surface. This approach has now been tested with high-quality lab-scale glass/Mo/CIGSe substrates. An efficiency of 18.3% has been i… Show more

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Cited by 86 publications
(53 citation statements)
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“…The best efficiencies for solar cells with sputtered or ALD deposited Zn(O,S) buffer layer are similar, 18.3% and 18.5% respectively (Klenk et al, 2013;Zimmermann et al, 2006). At the moment, the highest reported CBD deposited Zn(O,S) buffered solar cell efficiency is 20.9% (Kushiya, 2014).…”
mentioning
confidence: 90%
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“…The best efficiencies for solar cells with sputtered or ALD deposited Zn(O,S) buffer layer are similar, 18.3% and 18.5% respectively (Klenk et al, 2013;Zimmermann et al, 2006). At the moment, the highest reported CBD deposited Zn(O,S) buffered solar cell efficiency is 20.9% (Kushiya, 2014).…”
mentioning
confidence: 90%
“…So far, Zn(O,S) layers have been prepared by methods that are either slow, not in-line suitable or vacuum techniques, such as chemical bath deposition (CBD) (Buffière et al, 2011;Kushiya, 2004;Sáez-Araoz et al, 2008;Witte et al, 2013), atomic layer deposition (ALD) l t erjorkm n et l l t er-j rkm n et l., 2006; Sanders and Kitai, 1992;Zimmermann et al, 2006), sputtering (Grimm et al, 2011(Grimm et al, , 2010Klenk et al, 2013;Kobayashi et al, 2013;Nakamura et al, 2013). The best efficiencies for solar cells with sputtered or ALD deposited Zn(O,S) buffer layer are similar, 18.3% and 18.5% respectively (Klenk et al, 2013;Zimmermann et al, 2006).…”
mentioning
confidence: 99%
“…Among the different alternatives to CdS, Zn(O,S) alloys have been reported as one of the most promising candidates, and high efficiency devices up to 21% efficiency have already been reported with these layers. [3][4][5][6][7] In this case, control of the O/S content ratio is very important in order to ensure an optimal moderate spike-like conduction band alignment at the absorber/buffer heterojunction. 8 However, the analysis of the anion ratio of these buffer layers by non-destructive techniques is still challenging, being the use of techniques as X-ray uo-rescence or X-ray diffraction compromised by either the presence of interactions between the S and Mo signals (being the back contact in the cells constituted by a Mo thin lm) or their very small thickness (typically in the range 20-80 nm).…”
Section: Introductionmentioning
confidence: 99%
“…While some modifications to the process or cell stack may be required depending on the absorber type, the general finding is that sputtered Zn(O,S) works with sequentially processed and multi-source evaporated absorbers, wide-gap Cu(In,Ga)S2 and kesterite absorbers. In particular, an efficiency of 18.3% (with AR, confirmed) could be achieved with multi-source evaporated lab-scale absorber [6] without surface conditioning, annealing or light-soaking. …”
Section: Resultsmentioning
confidence: 98%