Isotope‐excited X‐ray fluorescence analysis of binary alloys using energy dispersion

Abstract

A radioisotope‐excited X‐ray fluorescence method for the analysis of binary alloys has been presented. In this energy dispersion analysis no standard specimens were needed. The method was applied to copper‐antimony alloys. The results were checked by another energy dispersion method based on X‐ray diffraction. X‐ray photons from the specimen were measured with an Si (Li) detector and a multichannel analyser was used to sort out the energies. The data were recorded on punched paper tape for computer processing.