2016
DOI: 10.1039/c6ra18668h
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Ionic liquid-enhanced soft resistive switching devices

Abstract: Left: SEM showing dendrites bridging the electrodes. Right: Retention test showing a final on/off ratio of 700 after 10 000+ s. The addition of IL to switching matrix triggers non-volatile memory and 10-fold reduction of operating voltage.

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Cited by 31 publications
(19 citation statements)
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“…Second, the global cation injection makes it easy to form multiple slimsy CFs rather than single robust CF inside RS layer, which is disadvantageous to the retention of LRS . Third, the excessive cation injection will cause gradual accumulation of active metal species in RS layer after long‐time repeating switching cycles, leading to decrease of HRS resistance and deterioration of device reliability …”
Section: Introductionmentioning
confidence: 99%
“…Second, the global cation injection makes it easy to form multiple slimsy CFs rather than single robust CF inside RS layer, which is disadvantageous to the retention of LRS . Third, the excessive cation injection will cause gradual accumulation of active metal species in RS layer after long‐time repeating switching cycles, leading to decrease of HRS resistance and deterioration of device reliability …”
Section: Introductionmentioning
confidence: 99%
“…[8][9][10] To address the challenges in polymer-based ReRAM, ionic liquids (ILs)-liquid salts that are commonly added to solid polymer electrolytes for various electrochemical applications [11][12][13][14][15] -are being considered. In a recent report, ILs were added to polymer-based CBRAM to reduce the formation (set) bias and increase endurance; [16] however, a detailed understanding of the role that ILs play in polymerbased resistive memory is still developing. Such understanding is important to uncover the microscopic mechanisms of conductive nanofilament formation and switching, [7] and how material structure and composition can be tailored to tune performance.…”
Section: Introductionmentioning
confidence: 99%
“…In CBRAM cells, a nanoscale conductive metallic path between an electrochemical active working electrode/anode (such as Ag or Cu) and a reasonably inert counter electrode/cathode (such as Pt, Au, or TiN) is formed or ruptured by generation, movement, and reduction of mobile metal cations (i.e., Ag + or Cu z + , where z denotes the charge value of the ionic species). CBRAMs are typically based on oxides (such as SiO 2 or Al 2 O 3 ), higher chalcogenides (e.g., GeSe), classical solid‐state cation conductors (e.g., AgI), and polymers (such as PVDF or PEO). In the simplest case, anodic oxidation of a metal electrode Me generating cations Me z + takes places when a positive voltage is applied between the anode and cathode (anodic oxidation)MeMez+ + ze…”
Section: Solid‐state Electrochemistry In Memristive Switchesmentioning
confidence: 99%