Ion Microscopy

Hlawacek, Gregor

doi:10.1007/978-3-030-00069-1_14

Cited by 12 publications

(25 citation statements)

References 161 publications

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“…A thin (<10 nm) layer of deposited carbon, primarily at the edges of the highest dosed features and common to such FIB processes, may also contribute to the image contrast (see Figure S2). The nanoscale features, discussed later, are processed with a single raster scan of the beam, which largely mitigates unwanted carbon deposition and yields reductions in the film height at the highest doses.…”

Section: Introductionmentioning

confidence: 99%

Direct-Write of Nanoscale Domains with Tunable Metamagnetic Order in FeRh Thin Films

Cress

Wickramaratne

Rosenberger

et al. 2020

ACS Appl. Mater. Interfaces

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We have directly written nanoscale patterns of magnetic ordering in FeRh films using focused helium-ion beam irradiation. By varying the dose, we pattern arrays with metamagnetic transition temperatures that range from the as-grown film temperature to below room temperature. We employ transmission electron microscopy, X-ray diffraction, and temperature-dependent transport measurements to characterize the as-grown film, and magneto-optic Kerr effect imaging to quantify the He+ irradiation-induced changes to the magnetic order. Moreover, we demonstrate temperature-dependent optical microscopy and conductive atomic force microscopy as indirect probes of the metamagnetic transition that are sensitive to the differences in dielectric properties and electrical conductivity, respectively, of FeRh in the antiferromagnetic (AF) and ferromagnetic (FM) states. Using density functional theory, we quantify strain- and defect-induced changes in spin-flip energy to understand their influence on the metamagnetic transition temperature. This work holds promise for in-plane AF–FM spintronic devices, by reducing the need for multiple patterning steps or different materials, and potentially eliminating interfacial polarization losses due to cross material interfacial spin scattering.

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Section: Introductionmentioning

confidence: 99%

Direct-Write of Nanoscale Domains with Tunable Metamagnetic Order in FeRh Thin Films

Cress

Wickramaratne

Rosenberger

et al. 2020

ACS Appl. Mater. Interfaces

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“…Chemical Surface Distribution. The total number of pixels in the selected raw SIMS images (Figure 2b−f) was 512 × 512, which covered 72.25 μm 2 of the surface, and 40 Ca, 24 Mg, 27 Al, and 28 Si were measured. 40 Ca was detected within the analyzed surface covering a total area of 89.8%.…”

Section: ■ Resultsmentioning

confidence: 99%

4D Surface Reconstruction of Micron-Sized Organic Calcite for the Characterization of Chemical Heterogeneity of Chalk Surfaces

et al. 2023

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Seawater injection into chalk reservoirs is a method for improved oil recovery (IOR) at the Norwegian Continental Shelf (NCS). During the injection of fluids for IOR, complex physicochemical interactions between the injected fluid and the reactive rock surface will take place, such as compaction and alterations of rock properties (e.g., porosity, permeability, wettability). The distribution of noncarbonate mineral phases in the reservoir and on the surface of the chalk will dictate wettability properties. Yet, the identification and quantification of nanometer-sized mineral phases on calcite surfaces have been challenging due to insufficient spatial resolution and sensitivity of the analytical methods used. On-shore chalk was used in this study. Helium ion microscopy (HIM) combined with in situ secondary ion mass spectrometry (SIMS) was used to produce secondary electron images for mapping surface morphology and topography correlated with chemical maps from SIMS. First, a 3D surface model was created from a series of secondary electron images acquired from different perspectives around the coccolith. A chemical image obtained by SIMS was developed on the same region of interest and projected onto the 3D surface model to create a 4D surface reconstruction (3D+1 concept). This includes surface chemistry information on sub-micron-sized noncarbonate phases on calcite grains. The surface distribution of noncarbonate phases added up to a minimum of 6.3%, where no 40 Ca had been detected. Moreover, 39.8% of the entire area is characterized by 40 Ca and 27 Al plus 28 Si. Compared with 5 wt % noncarbonate phases identified by whole-rock geochemistry, we identify at least 200−300% higher noncarbonate phase abundance than expected based on bulk geochemistry. This has a significant implication for the modeling of mineral surface charges, the major criteria for wettability calculations. Therefore, HIM-SIMS studies allow nanoscale mapping and mineral phase identification, which will enhance the knowledge of fluid−rock interactions for purposes related to IOR, carbon capture, and storage as well as for hydrogen storage.

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“…The microscopy functionality is primarily based on the detection of the secondary electrons that are generated by the finely focused ion beam as it is scanned across the sample. Compared with the scanning electron microscope (SEM), the HIM offers enhanced surface sensitivity, greater topographic contrast, and a larger depth of field [ 4 – 5 ]. A charge-neutralization system based on flooding the scanned region with low-energy electrons also permits high-quality imaging of electrically insulating materials, such as biological samples, thus avoiding the need for conductive coatings that can introduce artifacts and obscure nanoscale surface features [ 6 – 7 ].…”

Section: Introductionmentioning

confidence: 99%

“…This has also opened the door to in situ materials analysis in the HIM using secondary ion mass spectrometry [ 8 ]. Further forms of materials analysis using the HIM include techniques based on the collection of backscattered helium ions and ionoluminescence [ 5 ].…”

Section: Introductionmentioning

confidence: 99%

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A review of defect engineering, ion implantation, and nanofabrication using the helium ion microscope

Allen¹

2021

Beilstein J. Nanotechnol.

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The helium ion microscope has emerged as a multifaceted instrument enabling a broad range of applications beyond imaging in which the finely focused helium ion beam is used for a variety of defect engineering, ion implantation, and nanofabrication tasks. Operation of the ion source with neon has extended the reach of this technology even further. This paper reviews the materials modification research that has been enabled by the helium ion microscope since its commercialization in 2007, ranging from fundamental studies of beam–sample effects, to the prototyping of new devices with features in the sub-10 nm domain.

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Ion Microscopy

Cited by 12 publications

References 161 publications

Direct-Write of Nanoscale Domains with Tunable Metamagnetic Order in FeRh Thin Films

Direct-Write of Nanoscale Domains with Tunable Metamagnetic Order in FeRh Thin Films

4D Surface Reconstruction of Micron-Sized Organic Calcite for the Characterization of Chemical Heterogeneity of Chalk Surfaces

A review of defect engineering, ion implantation, and nanofabrication using the helium ion microscope

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