1998
DOI: 10.1016/s0257-8972(98)00421-6
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Ion energy distribution effects on degradation of optical properties of ion-bombarded copper mirrors

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Cited by 37 publications
(50 citation statements)
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“…Sputtering was performed by exposing specimens to plasma ions in a double mirror magnetic configuration [1]. Electron cyclotron resonance plasmas with densities of ~10 16 ions/m 3 and electron temperature of ~5 eV in deuterium or argon were used as a source of incident particles.…”
Section: Experimental Techniquementioning
confidence: 99%
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“…Sputtering was performed by exposing specimens to plasma ions in a double mirror magnetic configuration [1]. Electron cyclotron resonance plasmas with densities of ~10 16 ions/m 3 and electron temperature of ~5 eV in deuterium or argon were used as a source of incident particles.…”
Section: Experimental Techniquementioning
confidence: 99%
“…(In some cases, an even shorter exposure to low energy Ar plasma ions was applied for cleaning instead.) The reflectance at normal incidence in the wavelength range 220-650 nm, and the mass loss due to sputtering (to give the average sputter depth Δh) was measured after exposures (more details in [1]). Thus the rate of degradation of optical properties on the thickness of sputtered layer was found.…”
Section: Experimental Techniquementioning
confidence: 99%
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“…In agreement with the results of [7] the areas composed dominantly of grains with orientation close to (110) have highest sputtering rate, forming "valleys", and the areas composed dominantly of grains with orientation close to (100) have much lower sputtering rate forming the main parts of "ridges" with "peaks" composed of grains close to (111) orientation having lowest sputtering rate. Such surface relief is very much different from the relief of polycrystalline mirror specimens being sputtered under similar conditions [7,10,11,14], and this is a consequence of a quite complicated technology procedures used for preparation of this particular tungsten kind. Note that surface peculiarities due to sputtering are qualitatively similar for undamaged and damaged specimens, independently on the dose (0.3 or 3.0 dpa).…”
Section: Methodsmentioning
confidence: 98%
“…The initial reflectance of specimens was found to be noticeably below the nominal values for W [9], therefore a "soft" cleaning of their surfaces was provided in the DSM-2 device [10,11] before sputtering procedures were started. The rear sides (not irradiated with W +6 ions) were cleaned by exposing to low energy (~60 eV) ions of deuterium plasma (ion fluence 1.8x10 23 m -2 ), and the face sides (irradiated) -by short time exposing to ions of Ar plasma with ion energy of 200 eV (ion fluence 2x10 22 m -2 ).…”
Section: Methodsmentioning
confidence: 99%