1981
DOI: 10.1007/bf01050299
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Ion beam propagation and focusing

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1983
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Cited by 62 publications
(19 citation statements)
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“…Due to the large variety of ions and the wide range of ion energies used in material modifications, detailed analysis of ion beam attenuation and focusing is needed for each application. Nevertheless, since the principle of this type of focusing had been demonstrated, 16,17 and since data 18 indicate a reasonable range of ions in air, nonvacuum ion material modification seems feasible, with such a vacuum-atmosphere interface.…”
Section: Discussionmentioning
confidence: 99%
“…Due to the large variety of ions and the wide range of ion energies used in material modifications, detailed analysis of ion beam attenuation and focusing is needed for each application. Nevertheless, since the principle of this type of focusing had been demonstrated, 16,17 and since data 18 indicate a reasonable range of ions in air, nonvacuum ion material modification seems feasible, with such a vacuum-atmosphere interface.…”
Section: Discussionmentioning
confidence: 99%
“…This "standoff" distance prevents damage to the final focus section of the accelerator from the target explosion [37]. Ballistic transport uses a final focusing lens just outside the chamber and a supply of electrons to provide neutralization (neutralized ballistic transport) [38]; the detailed physics of the neutralization process is one of the key areas to be addressed by the NTX experiments [39,40], along with the optics of final focusing [41].…”
Section: Studies Of Beam Propagation In Fusion-chamber Plasmasmentioning
confidence: 99%
“…Detailed analysis of the ion beam focusing process, formed by diodes of various geometries, is presented in the work of Olson (1982). It is shown that magnetically insulated diodes have a rather small PIB divergence (ratio of PIB radius at half-height to the distance towards the diode), amounting to 1-4°, in contrast to reflex diodes and pinch-diodes.…”
Section: Introductionmentioning
confidence: 99%