2010
DOI: 10.1103/physrevb.81.245203
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Ion-beam modification of the magnetic properties ofGa1xMnxAsepilayers

Abstract: We study the controlled introduction of defects in GaMnAs by irradiating the samples with energetic ion beams, which modify the magnetic properties of the DMS. Our study focuses on the low-carrier-density regime, starting with as-grown GaMnAs films and decreasing even further the number of carriers, through a sequence of irradiation doses. We did a systematic study of magnetization as a function of temperature and of the irradiation ion dose. We also performed insitu room temperature resistivity measurements a… Show more

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citations
Cited by 18 publications
(14 citation statements)
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References 47 publications
(50 reference statements)
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“…Comparison with the effects of much higher energy ions indicates we can expect little or no net effect of the implantation on the macroscopic properties of the sample. 28 This is confirmed by the fact that we found no time dependence in the results over the course of the experiment and between runs on the same sample.…”
Section: Methodssupporting
confidence: 73%
“…Comparison with the effects of much higher energy ions indicates we can expect little or no net effect of the implantation on the macroscopic properties of the sample. 28 This is confirmed by the fact that we found no time dependence in the results over the course of the experiment and between runs on the same sample.…”
Section: Methodssupporting
confidence: 73%
“…The film with a high irradiation dose shows a pronounced maximum at E 180 meV, which can presumably be explained by the high density of intentionally introduced defects due to the heavy irradiation with ions, causing trapping and detrapping processes of charge carriers with this particular energy. An alternative explanation is the spin-dependent scattering from weakly interacting nanoscale magnetic clusters with fluctuating spin orientation, which form after the irradiation process due to the increased disorder [9]. However, we do not find a systematic magnetic field dependence of the resistance noise.…”
Section: Resultscontrasting
confidence: 72%
“…While for the non-irradiated sample a monotonic increase in DpEq can be observed, a high fluence of ions yields a distinct peak at 180 meV. This can be explained by capture and emission processes of charge carriers or alternatively by spin-dependent scattering from magnetic clusters with fluctuating spin orientation [9]. Samples with a higher Mn content (x 7%) exhibit dominating two-level processes superimposed on the 1{f -type signal, possibly due to a higher density of substitutional and interstitial Mn atoms.…”
Section: Discussionmentioning
confidence: 93%
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“…One of the alternative approaches to tune the hole concentration in semiconductors is ion irradiation [14][15][16][17]. After irradiation, some deep-level trapping centers are generated in the irradiated region, compensating free carriers.…”
Section: Introductionmentioning
confidence: 99%