Ion Beam Induced Luminescence of Alkali Halide Crystals

Abstract

New experimental results bearing on luminescence induced by ion beam on pure and doped alkali halide crystals are reviewed. In the optical spectra besides activator luminescence bands new intrinsic luminescence bands are observed. The mechanism of the recombination of electrons from the conduction band with V, hole centre is discussed. npliBeAeHb1 3KCIIepHMeHTaJIbHbIe pe3yJIbTaTbI no EiCCJIe~OBaHHA JIIoMIlHecUeHUllM I4eJIOYHO-raJIO112I-HbIX KpHCTaJIJIOB IlHAyUAPOBaHHOfi 110HHOfi 6OM6aPAHPOBKOfi. B OnTAYeCKHX CneKTpaX KpOMe aKT11BaTOPHbIX IIOJIOC Ha6JIWaaeTcrt M cO6CTBeHHart JIIoMHHeCIWHU11X. A11CcKyTHPyfieTcX MeXaHH3Mb1 peKoM6kiHaUHH 3JIeKTpOHOB 113 30HbI npOBOA11MOcTH C flIlPOYHbIMEi qeHTpaM11 v,.

Ionoluminescent response of several phosphor screens to keV ions of different masses

“…In early works, the phenomenon of luminescence induced by the impact of a keV energy ion on alkali halides was connected with the presence of contaminants in the crystal. Presently, it is believed that the origin of the light emission is radiation defects, 27 and therefore this phenomenon can be useful not only for surface studies but also for particulate dosimetry. nominal currents not greater than 30 mA.…”

Rapid measurement of charged particle beam profiles using a current flux grating

“…This method is mainly used to study profiles of low energy (few tens of keV) ion beams, (ii) two dimensional (2D) Faraday cup (FC) arrays 9 where, several small FCs are employed to image the beam and the FC array is precisely moved across the beam, (iii) wire scanner 10,11 where, a tiny wire is moved across the beam and simultaneously the beam current is obtained. There is also the (iv) multiwire scanner, 12 where multiple wires are used to form a linear gridded structure or a mesh and used to determine the beam profile, (v) knife edge method 10 employs a knife edge (probe) that is moved to intercept the beam, (vi) scintillation method employs scintillation screens (alkali halides, SiO 2 , etc., are known as good scintillators) 13,14 for beam profile measurements, and (vii) microchannel plate (MCP), 15 and (viii) gas electron multiplier (GEM) 16 detectors are used for detecting X-rays and other radiations via secondary processes. All the above mentioned devices have their own advantages and disadvantages.…”

Material characterization and modification using helium lon microscopy : various examples

“…Luminescence at about 2.4 -2.45 eV was previously observed, but its origin has not been exactly identified yet [115,[118][119][120]. The authors of Ref.…”

“…The authors of Ref. [118] attribute it to possible water or oil vapor contamination in the chamber vacuum. The vacuum in their described experiments was in the 10 -7 mbar range.…”

“…There is no clear agreement on the nature of the observed light emission [115][116][117][118]. Although damage of alkali halides by various types of ionizing radiation has been studied for decades, the picture of the processes that occur is not complete.…”