1990
DOI: 10.1016/0168-583x(90)90718-a
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Ion beam induced changes of the refractive index of PMMA

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Cited by 28 publications
(8 citation statements)
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“…The spatial distribution (depth profile) and the possible material compaction of the ionmodified layer are also of importance in this case. The optical constants and their depth profiles in that layer within PMMA are functions of implantation ion energy and fluence [7][8][9][10]. Thus, the modification of these material characteristics by the Fig.…”
Section: Experiments Results and Discussionmentioning
confidence: 99%
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“…The spatial distribution (depth profile) and the possible material compaction of the ionmodified layer are also of importance in this case. The optical constants and their depth profiles in that layer within PMMA are functions of implantation ion energy and fluence [7][8][9][10]. Thus, the modification of these material characteristics by the Fig.…”
Section: Experiments Results and Discussionmentioning
confidence: 99%
“…A reasonable assumption about the mechanism of the physico-chemical modification of Si + -implanted PMMA in this case is the break of the bonding arrangements of the polymer in the surface layer by the Si + ions and deposition of silicon. Some contribution of such a mechanism is not excluded, taking into account the significant role of the nuclear stopping of Si + ions during their implantation into PMMA according to the relatively high mass of silicon ion and its low energy of only 50 keV [7,15,16]. A similar broad ($180 nm fwhm) asymmetric PL band peaked near 600 nm (l ex = 488 nm) and red-shifted with ion fluence is known from PL measurements of Si + -implanted glass, the origin of which was attributed to the formation of amorphous Si [24].…”
Section: Photoluminescence and Raman Spectramentioning
confidence: 98%
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