2009
DOI: 10.1039/b816893h
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Ion beam degradation analysis of poly(3-hexylthiophene) (P3HT): can cryo-FIB minimize irradiation damage?

Abstract: In this study, to assess the influence of the temperature on the ion beam degradation, irradiation experiments on organic semiconductor materials were performed for both cryogenic and room temperature conditions. Thin P3HT films on silicon substrates were exposed to increasing ion doses in dual beam FIB. The degradation behaviour by means of a decrease in the C[double bond, length as m-dash]C band which corresponds to a loss of conjugation was investigated by means of Raman spectroscopy. In addition, atomic fo… Show more

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Cited by 12 publications
(12 citation statements)
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“…The effective electron dose at 5 keV, which is necessary to reduce the EBIC current by a factor of two in P3HT:PCBM solar cells, was 10 µC/cm 2 . The solar cell operation is much more sensitive to e‐beam damage compared to electron doses in e‐beam degradation studies, which induce a change in the surface potential by a similar amount (Sezen et al ., 2009). For this paper we chose solar cells with different defects to present the possibilities to detect them with EBIC measurements.…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…The effective electron dose at 5 keV, which is necessary to reduce the EBIC current by a factor of two in P3HT:PCBM solar cells, was 10 µC/cm 2 . The solar cell operation is much more sensitive to e‐beam damage compared to electron doses in e‐beam degradation studies, which induce a change in the surface potential by a similar amount (Sezen et al ., 2009). For this paper we chose solar cells with different defects to present the possibilities to detect them with EBIC measurements.…”
Section: Discussionmentioning
confidence: 99%
“…This dose is lower than what is used to expose a resist in electron beam lithography. It is also a factor of 100 times lower than the electron dose at 5 keV needed to reduce the surface potential by a similar amount in studies of e‐beam damage to P3HT films (Sezen et al ., 2009).…”
Section: Ebic Experimentsmentioning
confidence: 99%
“…Likewise, beam damage on delicate matter can produce artifacts and sample damage (Allison et al, 2010; Imai et al, 2003; Peckys et al, 2011). This can be delayed by using a low temperature sample stage, which, however, requires special equipment for a rapid sample freezing in order to prevent ice formation within the specimen (Clegg and Collyer, 1991; Sezen et al, 2009, 2011). Finally, the lack of capability to visualize dynamic processes and the non‐environmental conditions required (i.e., vacuum) further limits the application of TEM in following the structural dynamics of enzymatic cellulose degradation.…”
Section: Visualization Methods Applicable To Enzymatic Cellulose Hydrmentioning
confidence: 99%
“…The authors have recently been using this technique for the production of free‐standing polystyrene–platinum bimorph cantilever thermal microactuators for MEMS/NEMS applications (Lee et al ., 2011). These applications may, however, be limited by the creation of unwanted morphological and chemical modifications in the polymers due to variations in the surface structure of the polymer film (Ektessabi & Sano, 2000; Niihara et al ., 2005; Sezen et al ., 2009; Kim et al ., 2011; Sezen et al ., 2011). Critical issues in polymer micro/nanofabrication using the ion beam include direct sputtering and indirect thermal evaporation of surface atoms/molecules, depletion of main components of the polymer such as carbon, hydrogen, oxygen, etc., rearrangement of chemical bonds and cross‐linking, and incorporation of ions into the film (Ektessabi & Sano, 2000).…”
Section: Introductionmentioning
confidence: 99%
“…Possible routes to minimize the damage caused by the ion beam include milling the polymers at cryogenic temperatures (e.g. −150°C) to reduce local heating (Niihara et al ., 2005; Sezen et al ., 2009; Kim et al ., 2011; Sezen et al ., 2011), applying an electrically conductive coating or using an electron flood gun against ion charging (Stokes et al ., 2007) or removing the polymer at a faster rate using water vapour (Kochumalayil et al ., 2009a, b).…”
Section: Introductionmentioning
confidence: 99%