1998
DOI: 10.1016/s0168-583x(97)00874-4
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Ion beam analysis and alpha spectrometry of sources electrodeposited on several backings

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Cited by 10 publications
(2 citation statements)
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“…While the substrates that were examined in this study are commonly used for alpha spectrometry sample preparation, we did not fmd a lot of research in the literature comparing the yields and alpha particle resolutions of these substrates for suitability for alpha spectrometry. Ferrero Calabuig et al [17] examined the electrodeposition of uranium on molybdenum, nickel, stainless steel (SS), and titanium substrates using a method similar to the Hallstadius method [8]. In general, at lower thicknesses of uranium (between 0.65-21.3 11g/cm 2 ), they observed slightly improved resolution in the order Ti < SS < Mo<Ni.…”
Section: Resultsmentioning
confidence: 99%
“…While the substrates that were examined in this study are commonly used for alpha spectrometry sample preparation, we did not fmd a lot of research in the literature comparing the yields and alpha particle resolutions of these substrates for suitability for alpha spectrometry. Ferrero Calabuig et al [17] examined the electrodeposition of uranium on molybdenum, nickel, stainless steel (SS), and titanium substrates using a method similar to the Hallstadius method [8]. In general, at lower thicknesses of uranium (between 0.65-21.3 11g/cm 2 ), they observed slightly improved resolution in the order Ti < SS < Mo<Ni.…”
Section: Resultsmentioning
confidence: 99%
“…Conventional secondary ion mass spectrometry (SIMS) systems equipped with ion beam depeth profiling also can achieve namometer depth resolution for the alphaemitting radionuclides electrodeposited layer, together with a high level of detection and quantification [126]. In addition to XPS and SIMS, Rutherford backscattering spectroscopy (RBS) and glow discharge optical emission spectroscopy (GDOES) have been widely used to carry out the depthptofiling characterization [125,[127][128][129].…”
Section: Thickness Of Electrodeposited Alpha-sourcementioning
confidence: 99%