2016
DOI: 10.1016/j.memsci.2015.12.007
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Investigations on the interfacial capacitance and the diffusion boundary layer thickness of ion exchange membrane using electrochemical impedance spectroscopy

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Cited by 96 publications
(68 citation statements)
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“…information on the electrochemical properties of the membrane system [14][15][16][17][18]. The membrane resistance and the resistance of ionic transfer through the interface (i.e.…”
Section: Electrochemical Impedance Spectroscopy (Eis) Is a Powerful Tmentioning
confidence: 99%
See 1 more Smart Citation
“…information on the electrochemical properties of the membrane system [14][15][16][17][18]. The membrane resistance and the resistance of ionic transfer through the interface (i.e.…”
Section: Electrochemical Impedance Spectroscopy (Eis) Is a Powerful Tmentioning
confidence: 99%
“…The membrane resistance and the resistance of ionic transfer through the interface (i.e. the diffusion boundary layer and the electrical double layer) of the different commercial IEMs could be distinguished by the analysis of EIS under the condition of various salt concentration, liquid flow rate and temperature [16,18]. Especially, the EIS study of the IEM system performed by Park et al [19,20] provided an approach of investigating the BSA fouling phenomena on the AEM and helped to get a better insight into the changes of the interfacial layers between the AEM and solution.…”
Section: Electrochemical Impedance Spectroscopy (Eis) Is a Powerful Tmentioning
confidence: 99%
“…Estimating the Melt Structures In an aqueous solution system at room temperature, R ct can be expressed by Eq. (9), 34) where C s is the electrolyte concentration and γ is a coefficient. The parameter corresponding to electrolyte concentration in the present study is considered to be the concentration of an alkaline earth metal oxide that can move relatively freely in the melt.…”
Section: Correcting the Equivalent Circuit Components Andmentioning
confidence: 99%
“…By performing a fitting to an equivalent circuit, using complex nonlinear least-squares enables to interpret the experimental impedance data [37]. By this method, the geometrical capacitance of the film can usually be neglected but it requires an evaluation of the surface morphology of the IEM and the thickness of the diffusion double layer for the capacitance to be used [38].…”
Section: Membranes Properties and Their Determinationmentioning
confidence: 99%