Abstract:This paper presents the results of authors investigations on elaboration of a new thick film composition filled with carbon nanotubes (CNTs). The polymer composition consists of polymer vehicle, which is the solution of organic resin in certain combination of solvents, and functional phase-carbon nanotubes well dispersed in the vehicle. The pastes were applied with screen-printing on several substrates and temperature cured. The properties of obtained layers were characterized. Series of samples were prepared … Show more
“…An example plot of such a noise map, obtained for sample ED7100/Cu, is presented in Figure 3(a), revealing TANSs (strips on the graph) with activation energies of 0.32 and 0.23 eV. TANSs have been previously observed in TFRs made of RuO 2 -glass (Kolek et al, 2007), in IrO 2 (Pellegrini et al, 1983), in Bi 2 Ru 2 O 7 (Masoero et al, 1983) and in polymer compositions with carbon nanotubes (Słoma et al, 2011). The spectrum recorded at 77 K is shown in Figure 3(b), confirming that, apart from a dominant 1/f noise component, Lorentzians also exist that are associated with TANSs.…”
Section: Results and Analysismentioning
confidence: 71%
“…The high performance of modern processors allows the continuous calculation and recording of high resolution spectra in real time, which makes it possible to build a noise map, i.e. a detailed plot of power spectral density of fluctuating quantity versus frequency and temperature, revealing thermally activated noise sources (TANS) (Kolek et al, 2007;Stadler, 2011;Słoma et al, 2011).…”
Section: Ismentioning
confidence: 99%
“…In 1998, Dziedzic and Kolek (1998) published a report of exhaustive studies on low-frequency noise in thick-film resistors (TFRs), made of polymer compositions with carbon fillers, that were performed at room temperature by means of spectra measurements. Since that time, great progress has been achieved by investigators; it is possible to study fluctuating phenomena in TFRs over a wide range of temperatures, from liquid helium temperature (Kolek et al, 2007;Stadler, 2011;Słoma et al, 2011), up to 700 K (Chen et al, 1982;Pellegrini et al, 1983;Masoero et al, 1983;Stadler et al, 2014). The measurement technique applied by Kolek et al (2007), Stadler (2011), Słoma et al (2011…”
Section: Introductionmentioning
confidence: 99%
“…Since that time, great progress has been achieved by investigators; it is possible to study fluctuating phenomena in TFRs over a wide range of temperatures, from liquid helium temperature (Kolek et al, 2007;Stadler, 2011;Słoma et al, 2011), up to 700 K (Chen et al, 1982;Pellegrini et al, 1983;Masoero et al, 1983;Stadler et al, 2014). The measurement technique applied by Kolek et al (2007), Stadler (2011), Słoma et al (2011…”
Purpose
– The paper aims to get the knowledge about electrical properties, including noise, of modern polymer thick-film resistors (TFRs) in a wide range of temperature values, i.e. from 77 K up to room temperature. The sample resistors have been made of different combinations of resistive compositions, either ED7100 or MINICO (M2013, M2010), and conducting pastes (for contacts) Cu- or Au-based, deposited on FR-4 laminate.
Design/methodology/approach
– The paper opted for an experimental study using either current noise index measurement in room temperature for large batch of samples or noise spectra measurement in temperature range 77-300 K for selected samples. Obtained noise maps, i.e. plots of power spectral density of voltage fluctuations vs frequency and temperature, have been used for evaluation of noise describing parameters like material noise intensity C and figure of merit K, for TFRs made of different combinations of resistive/conductive materials. Comparison of the parameters gives the information about the quality of the technology and matching the conductive/resistive materials.
Findings
– Experiments confirmed that the main noise component is 1/f resistance noise. However, low-frequency noise spectroscopy revealed that also noise components of Lorentzian shape, associated with thermally activated noise sources exist. Their activation energies have been found to be of a few tenths of eV.
Research limitations/implications
– The noise intensity of polymer TFRs depends on technology process and/or contacts materials. The use of Au contacts leads to better noise properties of the resistors. The results of the studies might be helpful for further improvement of thick-film technology, especially for manufacturing low-noise, stable and reliable TFRs.
Practical implications
– The paper includes indications for the materials selection for thick-film technology to manufacture low-noise, reliable and stable TFRs.
Originality/value
– Experimental studies of electrical properties of polymer TFRs by means of noise spectra measurements in wide range of temperature is rare. They give fundamental knowledge about noise sources in the modern passive electronic components as well as practical indications of selection material for thick-film technology, to obtain high performance components and get technological advantage.
“…An example plot of such a noise map, obtained for sample ED7100/Cu, is presented in Figure 3(a), revealing TANSs (strips on the graph) with activation energies of 0.32 and 0.23 eV. TANSs have been previously observed in TFRs made of RuO 2 -glass (Kolek et al, 2007), in IrO 2 (Pellegrini et al, 1983), in Bi 2 Ru 2 O 7 (Masoero et al, 1983) and in polymer compositions with carbon nanotubes (Słoma et al, 2011). The spectrum recorded at 77 K is shown in Figure 3(b), confirming that, apart from a dominant 1/f noise component, Lorentzians also exist that are associated with TANSs.…”
Section: Results and Analysismentioning
confidence: 71%
“…The high performance of modern processors allows the continuous calculation and recording of high resolution spectra in real time, which makes it possible to build a noise map, i.e. a detailed plot of power spectral density of fluctuating quantity versus frequency and temperature, revealing thermally activated noise sources (TANS) (Kolek et al, 2007;Stadler, 2011;Słoma et al, 2011).…”
Section: Ismentioning
confidence: 99%
“…In 1998, Dziedzic and Kolek (1998) published a report of exhaustive studies on low-frequency noise in thick-film resistors (TFRs), made of polymer compositions with carbon fillers, that were performed at room temperature by means of spectra measurements. Since that time, great progress has been achieved by investigators; it is possible to study fluctuating phenomena in TFRs over a wide range of temperatures, from liquid helium temperature (Kolek et al, 2007;Stadler, 2011;Słoma et al, 2011), up to 700 K (Chen et al, 1982;Pellegrini et al, 1983;Masoero et al, 1983;Stadler et al, 2014). The measurement technique applied by Kolek et al (2007), Stadler (2011), Słoma et al (2011…”
Section: Introductionmentioning
confidence: 99%
“…Since that time, great progress has been achieved by investigators; it is possible to study fluctuating phenomena in TFRs over a wide range of temperatures, from liquid helium temperature (Kolek et al, 2007;Stadler, 2011;Słoma et al, 2011), up to 700 K (Chen et al, 1982;Pellegrini et al, 1983;Masoero et al, 1983;Stadler et al, 2014). The measurement technique applied by Kolek et al (2007), Stadler (2011), Słoma et al (2011…”
Purpose
– The paper aims to get the knowledge about electrical properties, including noise, of modern polymer thick-film resistors (TFRs) in a wide range of temperature values, i.e. from 77 K up to room temperature. The sample resistors have been made of different combinations of resistive compositions, either ED7100 or MINICO (M2013, M2010), and conducting pastes (for contacts) Cu- or Au-based, deposited on FR-4 laminate.
Design/methodology/approach
– The paper opted for an experimental study using either current noise index measurement in room temperature for large batch of samples or noise spectra measurement in temperature range 77-300 K for selected samples. Obtained noise maps, i.e. plots of power spectral density of voltage fluctuations vs frequency and temperature, have been used for evaluation of noise describing parameters like material noise intensity C and figure of merit K, for TFRs made of different combinations of resistive/conductive materials. Comparison of the parameters gives the information about the quality of the technology and matching the conductive/resistive materials.
Findings
– Experiments confirmed that the main noise component is 1/f resistance noise. However, low-frequency noise spectroscopy revealed that also noise components of Lorentzian shape, associated with thermally activated noise sources exist. Their activation energies have been found to be of a few tenths of eV.
Research limitations/implications
– The noise intensity of polymer TFRs depends on technology process and/or contacts materials. The use of Au contacts leads to better noise properties of the resistors. The results of the studies might be helpful for further improvement of thick-film technology, especially for manufacturing low-noise, stable and reliable TFRs.
Practical implications
– The paper includes indications for the materials selection for thick-film technology to manufacture low-noise, reliable and stable TFRs.
Originality/value
– Experimental studies of electrical properties of polymer TFRs by means of noise spectra measurements in wide range of temperature is rare. They give fundamental knowledge about noise sources in the modern passive electronic components as well as practical indications of selection material for thick-film technology, to obtain high performance components and get technological advantage.
“…Polymer thick-film resistors (PTFRs) have many advantages, among others a wide resistivity range, low processing temperature, low cost. Although they have been used in electronics for many years, they are considered as good candidates for the next generation of functional electronic components, especially due to their flexibility [6,7]. Manufacturing technologies of this material are still in the developing stage.…”
Graphene is a very promising material for potential applications in many fields. Since manufacturing technologies of graphene are still at the developing stage, low-frequency noise measurements as a tool for evaluating their quality is proposed. In this work, noise properties of polymer thick-film resistors with graphene nano-platelets as a functional phase are reported. The measurements were carried out in room temperature. 1/f noise caused by resistance fluctuations has been found to be the main component in the specimens. The parameter values describing noise intensity of the polymer thick-film specimens have been calculated and compared with the values obtained for other thick-film resistors and layers used in microelectronics. The studied polymer thick-film specimens exhibit rather poor noise properties, especially for the layers with a low content of the functional phase.
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