2011 12th European Conference on Radiation and Its Effects on Components and Systems 2011
DOI: 10.1109/radecs.2011.6131368
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Investigations of single event effects with heavy ions of energies up to 1.5 GeV/n

Abstract: The ESA SEU-Monitor, a DDR2 SDRAM and a power MOSFET have been irradiated at GSI with ions of energies from 80 to 1500 MeV/n. The results are compared to low energy (< 50 MeV/n) data

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Cited by 2 publications
(2 citation statements)
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“…The region near threshold (∼2.6-4.5 MeVcm 2 /mg) exhibits an abrupt decrease with LET while showing a significant spread among different facilities. As is shown in detail in [14], this spread is also observed among data corresponding to the same facility and different individual components (which are merged here for simplification) and is therefore mainly attributed to the spread in the sensitivity of the different components tested. The uncertainty on the actual LET value when the ions reach the SV might also play an important role.…”
Section: Heavy Ion Measurementsmentioning
confidence: 74%
See 1 more Smart Citation
“…The region near threshold (∼2.6-4.5 MeVcm 2 /mg) exhibits an abrupt decrease with LET while showing a significant spread among different facilities. As is shown in detail in [14], this spread is also observed among data corresponding to the same facility and different individual components (which are merged here for simplification) and is therefore mainly attributed to the spread in the sensitivity of the different components tested. The uncertainty on the actual LET value when the ions reach the SV might also play an important role.…”
Section: Heavy Ion Measurementsmentioning
confidence: 74%
“…HI tests were performed by ESA on the SEU Monitor in five different test facilities covering an LET range of ∼1-65 MeVcm 2 /mg and an energy range of ∼10-1500 MeV/n. Details about the measurements are provided in [13], [14]. The facilities used were RADEF, UCL, TAMU, GSI and KVI and the set of cross section measurements as a function of LET is shown in Fig.…”
Section: Heavy Ion Measurementsmentioning
confidence: 99%