1969
DOI: 10.1080/14786436908228210
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Investigations of dislocation strain fields using weak beams

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Cited by 650 publications
(144 citation statements)
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“…[22]. Using the weak beam (WB) dark field (DF) TEM imaging mode [23] edge dislocations are visible in (2-420) and (2-200) reflex images, while screw dislocations are highlighted in 000-4 WBDF images. In all cases the g-3g condition was used [24].…”
Section: Methodsmentioning
confidence: 99%
“…[22]. Using the weak beam (WB) dark field (DF) TEM imaging mode [23] edge dislocations are visible in (2-420) and (2-200) reflex images, while screw dislocations are highlighted in 000-4 WBDF images. In all cases the g-3g condition was used [24].…”
Section: Methodsmentioning
confidence: 99%
“…5), using a transmission electron microscope (TEM). TEM has proven to be a powerful tool for studying the structure and arrangement of dislocations, with seminal work laid out by Cockayne et al 6 in 1969 by the introduction of the weak beam method 6,7 .…”
mentioning
confidence: 99%
“…For example, in scanning mode (STEM) direct imaging of the crystal lattice can be coupled with spectroscopic analysis to yield chemical information at the unit cell level. [8] In imaging mode the technique is routinely used for identification and characterisation of defect structures; [9] in diffraction mode, detailed investigations of both symmetry [10] and crystal structure [11] are possible. Precision control of sample position and tilt, coupled with rapid acquisition of digital images, has contributed strongly to the development of holographic methods for the measurement of local fields within structures, [12] and tomographic approaches to three dimensional characterisation of microstructure.…”
Section: Introductionmentioning
confidence: 99%