2010
DOI: 10.1142/s0217984910024262
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INVESTIGATION PROPERTIES OF a-Si1-xCx:H FILMS ELABORATED BY CO-SPUTTERING OF Si AND 6H-SiC

Abstract: Hydrogenated amorphous SiC films ( a - Si 1-x C x: H ) were prepared by DC magnetron sputtering technique on p type Si (100) and corning 9075 substrates at low temperature, by using 32 sprigs of silicon carbide (6 H - SiC ). The deposited film a - Si 1-x C x: H was realized under a mixture of argon and hydrogen gases. The ( a - Si 1-x C x: H ) films have been investigated by scanning electronic microscopy equipped with EDS system (SEM-EDS), X-rays diffraction (XRD), secondary ions mass spectrometry (SIMS), Fou… Show more

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Cited by 7 publications
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“…Figure 4 depicts the diffuse reflectance spectrum where (F (R)E) 1/2 versus E is plotted and the band gap energy estimated is 3.05 eV approximately corresponds to 406 nm of wavelength. This band gap energy is closer to the band gap energy of the SiC of polytype 6H-SiC [16,17]. This justifies the use of 365 nm (3.47 eV) UV light as incident radiation for 6H-SiC in our study which is capable of promoting the electron from the valance to conduction band and thereby triggering photoreduction process.…”
Section: Characterization Of Catalyst Semiconductor Materialssupporting
confidence: 64%
“…Figure 4 depicts the diffuse reflectance spectrum where (F (R)E) 1/2 versus E is plotted and the band gap energy estimated is 3.05 eV approximately corresponds to 406 nm of wavelength. This band gap energy is closer to the band gap energy of the SiC of polytype 6H-SiC [16,17]. This justifies the use of 365 nm (3.47 eV) UV light as incident radiation for 6H-SiC in our study which is capable of promoting the electron from the valance to conduction band and thereby triggering photoreduction process.…”
Section: Characterization Of Catalyst Semiconductor Materialssupporting
confidence: 64%