2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs 2011
DOI: 10.1109/ispsd.2011.5890843
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Investigation on wirebond-less power module structure with high-density packaging and high reliability

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Cited by 37 publications
(5 citation statements)
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“…Compared with conventional alumina ceramic structure, the Cu pin structure enabled a 50% reduction in the thermal resistance of the overall structure. Compared with the conventional Si-based wirebonded package, the loss reduction with SiC devices was 57%-87% using the Cu pin structure [60], [61].…”
Section: -D Packaging Techniquementioning
confidence: 99%
“…Compared with conventional alumina ceramic structure, the Cu pin structure enabled a 50% reduction in the thermal resistance of the overall structure. Compared with the conventional Si-based wirebonded package, the loss reduction with SiC devices was 57%-87% using the Cu pin structure [60], [61].…”
Section: -D Packaging Techniquementioning
confidence: 99%
“…Today, the most advanced solutions use the Printed Circuit Board (PCB) technology, the multi-layer interconnects allowing for a reduction of stray inductances [11]. Main solutions are:…”
Section: A Literature Overviewmentioning
confidence: 99%
“…Figure 13 illustrates structure schematics of a new package and of a conventional package. In order to realize high power density, newly developed structure has copper pin attached each chip electrode as alternative elements to wire-bond [4]. As the measure against a rise of the chip temperature Tj accompanying the high power density, low thermal-resistance is attained by adopting the direct copper bonding (DCB) board which has thick Cu board and Silicon-Nitride (Si3N4) board [5].…”
Section: B Sic-mosfet/sic-sbd Modulementioning
confidence: 99%